Cylindrical geometry: a further step in active microwave tomography

Autor: Broquetas Ibars, Antoni|||0000-0001-9801-9145, Jofre Roca, Lluís|||0000-0002-0547-901X, Cardama Aznar, Ángel, Elias Fusté, Antoni|||0000-0001-6449-4458, Rius Casals, Juan Manuel|||0000-0003-0606-5422, Romeu Robert, Jordi|||0000-0003-0197-5961

Publikováno v: UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname

A prototype imaging system for active microwave tomography using cylindrical geometry has been developed, making it possible to obtain images of the dielectric properties of biological targets at 2.45 GHz. This configuration allows a fast exploration

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::895063c2ae92bf06aa3ae08227534b2e
http://hdl.handle.net/2117/1767

A new domain for image analysis: VLSI circuits testing, with Romuald, specialized in parallel image processing

Autor: J. Laurent, C. Rubat Du Merac, P. Jutier, B. Courtois

Publikováno v: Pattern Recognition Letters
Pattern Recognition Letters, Elsevier, 1983, July ; 1(5-6), pp.347-57. ⟨10.1016/0167-8655(83)90074-0⟩

In this paper we describe some aspects of specifying, designing and evaluating a specialized machine, Romuald, for the capture, coding, and processing of video and scanning electron microscope (SEM) pictures. First we present the functional organizat

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e19558d1b44128bdd7b3450220f2d350
https://doi.org/10.1016/0167-8655(83)90074-0

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.

Towards automatic failure analysis of complex ICs through e-beam testing

Autor: Bergher, L., Laurent, J., Courtois, B., Collin, J.P

Publikováno v: International-Test-Conference-1986-Proceedings.-Testing's-Impact-on-Design-and-Technology-Cat.-No.-86CH2339-0.
International-Test-Conference-1986-Proceedings.-Testing's-Impact-on-Design-and-Technology-Cat.-No.-86CH2339-0., 1986, Washington, DC, United States. pp.465-71

ISBN: 0818607262; A strategy is derived for failure analysis in random logic devices such as microprocessors and other VLSI chips when the electrical scheme is not known. This strategy is based on the use of a test tool composed of a scanning electro

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::9231da7530d4a70b5431d37de2a5592d
https://hal.archives-ouvertes.fr/hal-00013436

Recognizing and Locating Polyhedral Objects from Sparse Range Data

Autor: Roger Mohr, S. Qiang, Karl Tombre

Publikováno v: 9th International Conference on Pattern Recognition (ICPR '88)
9th International Conference on Pattern Recognition (ICPR '88), Nov 1988, Rome, Italy. pp.104--106, ⟨10.1109/ICPR.1988.28182⟩
ICPR

International audience; A model-based approach is described for recognizing and locating polyhedral objects from sparse light-stripe data. Based on two scans, consistent interpretations are provided by locating scanned line segments on the faces of a

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::de9182498a9054c9eceff3cc8b7fb057
https://hal.inria.fr/inria-00548477