Zobrazeno 1 - 3
of 3
pro vyhledávání: '"c-Si passivation"'
Autor:
Zhen Zheng, Junyang An, Ruiling Gong, Yuheng Zeng, Jichun Ye, Linwei Yu, Ileana Florea, Pere Roca i Cabarrocas, Wanghua Chen
Publikováno v:
Nanomaterials, Vol 11, Iss 7, p 1803 (2021)
In this work, we report the same trends for the contact potential difference measured by Kelvin probe force microscopy and the effective carrier lifetime on crystalline silicon (c-Si) wafers passivated by AlOx layers of different thicknesses and subm
Externí odkaz:
https://doaj.org/article/d2558ab8060b47bdbe715d5f83706b3f
Autor:
Wanghua Chen, Zhen Zheng, Ileana Florea, Ruiling Gong, Pere Roca i Cabarrocas, Junyang An, Linwei Yu, Jichun Ye, Yuheng Zeng
Publikováno v:
Nanomaterials
Nanomaterials, MDPI, 2021, 11 (7), pp.1803. ⟨10.3390/nano11071803⟩
Nanomaterials, Vol 11, Iss 1803, p 1803 (2021)
Volume 11
Issue 7
Nanomaterials, MDPI, 2021, 11 (7), pp.1803. ⟨10.3390/nano11071803⟩
Nanomaterials, Vol 11, Iss 1803, p 1803 (2021)
Volume 11
Issue 7
In this work, we report the same trends for the contact potential difference measured by Kelvin probe force microscopy and the effective carrier lifetime on crystalline silicon (c-Si) wafers passivated by AlOx layers of different thicknesses and subm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::573973c2fb793e0fcfcd1d3b348450e0
https://hal.archives-ouvertes.fr/hal-03447656
https://hal.archives-ouvertes.fr/hal-03447656
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