Development of At-speed Interconnect Test to Capture Marginal Open Defect on FPGA.

Autor: bin Mohamed Sultan, Fahmy Hafriz, binti Dahari, Zuraini, Koh, Yien Yien, Da Cunha, Neil, Ng, Jia Tian

Publikováno v: 9th International Conference on Robotic, Vision, Signal Processing & Power Applications; 2017, p27-35, 9p