Zobrazeno 1 - 10
of 103 791
pro vyhledávání: '"atomic resolution"'
Autor:
Luo, Zheng, Feng, Ming, Gao, Zijian, Yu, Jinyang, Hu, Liang, Wang, Tao, Xue, Shenao, Zhou, Shen, Ouyang, Fangping, Feng, Dawei, Xu, Kele, Wang, Shanshan
The emergence of deep learning (DL) has provided great opportunities for the high-throughput analysis of atomic-resolution micrographs. However, the DL models trained by image patches in fixed size generally lack efficiency and flexibility when proce
Externí odkaz:
http://arxiv.org/abs/2410.17631
Autor:
Crozier, Peter A., Leibovich, Matan, Haluai, Piyush, Tan, Mai, Thomas, Andrew M., Vincent, Joshua, Mohan, Sreyas, Morales, Adria Marcos, Kulkarni, Shreyas A., Matteson, David S., Wang, Yifan, Fernandez-Granda, Carlos
Nanoparticle surface structural dynamics is believed to play a significant role in regulating functionalities such as diffusion, reactivity, and catalysis but the atomic-level processes are not well understood. Atomic resolution characterization of n
Externí odkaz:
http://arxiv.org/abs/2407.17669
Autor:
Specht, Petra, Kang, Joo H., Tarafder, Kartick, Cieslinski, Robert, Barton, David, Barton, Bastian, Carlsson, Anna, Wang, Lin-Wang, Kisielowski, Christian
The static and genuine structure of small rhodium and rhodium/tungsten nanoparticles on an alumina support can be imaged with atomic resolution even if single digit atom clusters are investigated. Low dose rate electron microscopy is key to the achie
Externí odkaz:
http://arxiv.org/abs/2406.05689
Autor:
Wei, Jiake, Xu, Zhangze, Shen, Wenjie, Feng, Bin, Ishikawa, Ryo, Shibata, Naoya, Ikuhara, Yuichi, Bai, Xuedong
Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns. However, f
Externí odkaz:
http://arxiv.org/abs/2406.00948
Publikováno v:
Appl. Phys. Lett. 25 (2024), 150502
Instrumentation developments in electron energy-loss spectroscopy (EELS) in the scanning transmission electron microscope (STEM) one decade ago paved the way for combining milli-electronvolt energy resolution in spectroscopy with \r{A}ngstr\"om-sized
Externí odkaz:
http://arxiv.org/abs/2408.09148
Autor:
Sivakumar, Nikhil S., Aretz, Joost, Scherb, Sebastian, Mavrič, Marion van Midden, Huijgen, Nora, Kamber, Umut, Wegner, Daniel, Khajetoorians, Alexander A., Rösner, Malte, Hauptmann, Nadine
Scanning tunneling microscopy is the method of choice for characterizing charge density waves by imaging the variation in atomic-scale contrast of the surface. Due to the measurement principle of scanning tunneling microscopy, the electronic and latt
Externí odkaz:
http://arxiv.org/abs/2407.17231
Akademický článek
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Autor:
Chazot, Aurélie1 (AUTHOR), Zimberger, Claire1 (AUTHOR), Feracci, Mikael1 (AUTHOR), Moussa, Adel2 (AUTHOR), Good, Steven2 (AUTHOR), Sommadossi, Jean-Pierre2 (AUTHOR), Alvarez, Karine1 (AUTHOR), Ferron, François1,3 (AUTHOR) francois.ferron@univ-amu.fr, Canard, Bruno1,3 (AUTHOR) bruno.canard@univ-amu.fr
Publikováno v:
PLoS Biology. 8/27/2024, Vol. 22 Issue 8, p1-24. 24p.
Publikováno v:
Advances in Physics: X, Vol 9, Iss 1 (2024)
ABSTRACTThree-dimensional (3D) local atomic structure around specific functional atom plays a crucial role in functional materials, but it has not been able to be analyzed by a standard structure analysis method of x-ray diffraction (XRD) because thi
Externí odkaz:
https://doaj.org/article/3e4f902656b84b9b94fcb6dc51b1058c