Zobrazeno 1 - 5
of 5
pro vyhledávání: '"and Stuart K. Ross"'
Autor:
R. Bruce Klemm, Louis J. Stief, and Paul S. Monks, R. Peyton ThornJr., Zhengyu Zhang, and Stuart K. Ross, Szu-Cherng Kuo
Publikováno v:
The Journal of Physical Chemistry A. 102:846-851
Photoionization efficiency (PIE) spectra of the CH2CN radical were measured over the wavelength range λ = 115−130 nm using a discharge-flow−photoionization mass spectrometer coupled to a dispersed synchrotron-radiation source. The cyanomethyl ra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2435c062325613102642e0ab5486eeab
https://doi.org/10.1021/jp973164j
https://doi.org/10.1021/jp973164j
Autor:
Russell D. Johnson, Thorn, R. Peyton, Louis J. Stief, Zhengyu Zhang, Stuart K. Ross, R. Bruce Klemm, Paul S. Monks, Szu-Cherng Kuo
Publikováno v:
The Journal of Physical Chemistry A. 101:4035-4041
Photoionization efficiency (PIE) spectra of HNO were measured over the wavelength range λ = 110−125 nm and in the ionization threshold region, λ = 118−124 nm, using a discharge flow-photoionization...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ec69b674388bf8907866fc3c9b006cd0
https://doi.org/10.1021/jp9705941
https://doi.org/10.1021/jp9705941
Publikováno v:
The Journal of Physical Chemistry A. 101:1104-1116
The thermal dissociation of N2O in argon was investigated by monitoring the formation of O(3P) atoms in the reflected shock regime using atomic resonance absorption spectrophotometry (ARAS). The to...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d5efd53c5acfc51e145fecf0ad7f7fcf
https://doi.org/10.1021/jp962416y
https://doi.org/10.1021/jp962416y
Autor:
Eric J. Houser, Duane L. Simonson, Jennifer L. Stepnowski, Mike R. Papantonakis, Stuart K. Ross, Stanley V. Stepnowski, Eric S. Snow, Keith F. Perkins, Chet Bryant, Peter LaPuma, Gary Hook, R. Andrew McGill
Publikováno v:
ACS Symposium Series ISBN: 9780841239647
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ba1af66688504bea185a9ae04c51f31
https://doi.org/10.1021/bk-2007-0980.ch005
https://doi.org/10.1021/bk-2007-0980.ch005
Publikováno v:
Analyst; Apr2008, Vol. 133 Issue 5, p602-607, 6p