Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Zuned Ahmed"'
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 13, Iss 1, Pp 1120-1140 (2022)
Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has become an important tool to characterize new material systems as well as devices. Current instruments permit robust scanning over large areas, atomic-scale lateral
Externí odkaz:
https://doaj.org/article/18f043dbdb4f445b81c6237a5c735f14
Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has become an important tool to characterize new material systems as well as devices. Current instruments permit robust scanning over large areas, atomic scale lateral
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::beeeab3d592b1d683c190ac34a242dc8
https://doi.org/10.3762/bxiv.2022.46.v1
https://doi.org/10.3762/bxiv.2022.46.v1
