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pro vyhledávání: '"Zuned Ahmed"'
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 13, Iss 1, Pp 1120-1140 (2022)
Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has become an important tool to characterize new material systems as well as devices. Current instruments permit robust scanning over large areas, atomic-scale lateral
Externí odkaz:
https://doaj.org/article/18f043dbdb4f445b81c6237a5c735f14
