Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Zubair Abdullah-Vetter"'
Autor:
Zubair Abdullah‐Vetter, Priya Dwivedi, Yoann Buratti, Arcot Sowmya, Thorsten Trupke, Ziv Hameiri
Publikováno v:
Progress in Photovoltaics: Research and Applications.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2bf5818c5705fa035013d7faab97bb01
https://doi.org/10.1002/pip.3683
https://doi.org/10.1002/pip.3683
Autor:
Zubair Abdullah-Vetter, Priya Dwivedi, Yoann Buratti, Alfred Krzywicki, Arcot Sowmya, Thorsten Trupke, Ziv Hameiri
Publikováno v:
2022 IEEE 49th Photovoltaics Specialists Conference (PVSC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e224dee02080b0d2f47f25ccbf5a1862
https://doi.org/10.1109/pvsc48317.2022.9938500
https://doi.org/10.1109/pvsc48317.2022.9938500
Autor:
Zubair Abdullah-Vetter, Priya Dwivedi, Robert Lee Chin, Brendan Wright, Thorsten Trupke, Ziv Hameiri
Publikováno v:
2022 IEEE 49th Photovoltaics Specialists Conference (PVSC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eeb64103ebe9b0e03fe645a0bef5bc30
https://doi.org/10.1109/pvsc48317.2022.9938942
https://doi.org/10.1109/pvsc48317.2022.9938942
Publikováno v:
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC).
Identifying and quantifying loss mechanisms in solar cells are key requirements for increasing cell efficiencies. In this study, we present a novel method based on luminescence images to identify and quantify losses in silicon cells using a state of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7bc9e4f40512041177ec1d476f12348d
https://doi.org/10.1109/pvsc43889.2021.9518512
https://doi.org/10.1109/pvsc43889.2021.9518512
Autor:
Priya Dwivedi, Thorsten Trupke, Arcot Sowmya, Ziv Hameiri, Zubair Abdullah-Vetter, Yoann Buratti
Publikováno v:
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC).
Defect detection is a critical aspect of assuring the quality and reliability of silicon solar cells and modules. Luminescence imaging has been widely adopted as a fast method for analyzing photovoltaic devices and detecting faults. However, visual i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::503ba44a3fac943e1b4427db547a6efd
https://doi.org/10.1109/pvsc43889.2021.9518702
https://doi.org/10.1109/pvsc43889.2021.9518702