From nano-voids to blisters in hydrogenated amorphous silicon

Autor: C. Frigeri a, L. Nasi a, M. Serényi b, N.Q. Khánh b, Zs. Szekrényes c, K. Kamarás c, A. Csik d

Publikováno v: Physics, Chemistry and Application of Nanostructures, edited by V. E. Borisenko, S. V. Gaponenko, V. S. Gurin and C. H. Kam, pp. 176–179. Singapore: World Scientific, 2013
info:cnr-pdr/source/autori:C. Frigeri 1, L. Nasi 1, M. Serényi 2, N. Q. Khánh 2, Zs. Szekrényes3, K. Kamarás 3, A. Csik 4/titolo:From nano-voids to blisters in hydrogenated amorphous silicon/titolo_volume:Physics, Chemistry and Application of Nanostructures/curatori_volume:V. E. Borisenko, S. V. Gaponenko, V. S. Gurin and C. H. Kam/editore: /anno:2013
NANOMEETING-2013, Minsk (BY), 28-31 May 2013
info:cnr-pdr/source/autori:C. Frigeri a, L. Nasi a, M. Serényi b, N.Q. Khánh b, Zs. Szekrényes c, K. Kamarás c, A. Csik d/congresso_nome:NANOMEETING-2013/congresso_luogo:Minsk (BY)/congresso_data:28-31 May 2013/anno:2013/pagina_da:/pagina_a:/intervallo_pagine

AFM and FTIR spectroscopy were applied to study the relationship between surface blisters and nanovoids in annealed hydrogenated a-Si. The influence of the H bonding configuration on the way the nanovoids give rise to the blisters is discussed. Annea

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https://publications.cnr.it/doc/230513