Zobrazeno 1 - 10
of 249
pro vyhledávání: '"Zoethout, E"'
Publikováno v:
In Thin Solid Films 1 June 2022 751
Molecular contamination of a grazing incidence collector for extreme ultraviolet (EUV) lithography was experimentally studied. A carbon film was found to have grown under irradiation from a pulsed tin plasma discharge. Our studies show that the film
Externí odkaz:
http://arxiv.org/abs/1411.4509
We study extreme ultraviolet (EUV) radiation induced defects in single-layer graphene. Two mechanisms for inducing defects in graphene were separately investigated: photon induced chemical reactions between graphene and background residual gases, and
Externí odkaz:
http://arxiv.org/abs/1401.2352
Publikováno v:
Journal of Applied Physics; 12/14/2022, Vol. 132 Issue 22, p1-13, 13p
Autor:
Yakunin, S. N., Makhotkin, I. A., Chuev, M. A., Pashaev, E. M., Zoethout, E., Louis, E., van de Kruijs, R. W. E., Seregin, S. Yu., Subbotin, I. A., Novikov, D. V., Bijkerk, F., Kovalchuk, M. V.
We present a model independent approach for the reconstruction of the atomic concentration profile in a nanoscale layered structure, as measured using the X-ray fluorescence yield modulated by an X-ray standing wave (XSW). The approach is based on th
Externí odkaz:
http://arxiv.org/abs/1309.3133
Publikováno v:
J. Appl. Phys. 114, 044313 (2013)
We use Raman spectroscopy to show that exposing few-layer graphene to extreme ultraviolet (EUV, 13.5 nm) radiation, i.e. relatively low photon energy, results in an increasing density of defects. Furthermore, exposure to EUV radiation in a H2 backgro
Externí odkaz:
http://arxiv.org/abs/1304.4395
Autor:
Bystrov, K., Westerhout, J., Matveeva, M., Litnovsky, A., Marot, L., Zoethout, E., De Temmerman, G.
Publikováno v:
J. Nucl. Mater. 415 (1S), S149-S152 (2011)
Fine-grain graphite targets have been exposed to ITER divertor relevant plasmas in Pilot-PSI to address material migration issues in fusion devices. Optical emission spectroscopy and mass loss measurements have been employed to quantify gross chemica
Externí odkaz:
http://arxiv.org/abs/1210.3502
Publikováno v:
In Applied Surface Science 30 October 2014 317:745-751
Publikováno v:
In Applied Surface Science 15 November 2013 285 Part B:293-299
Autor:
Bosgra, J., Veldhuizen, L.W., Zoethout, E., Verhoeven, J., Loch, R.A., Yakshin, A.E., Bijkerk, F.
Publikováno v:
In Thin Solid Films 2 September 2013 542:210-213