Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Zimmermann, Michael Haub"'
Publikováno v:
Micromachines; Volume 13; Issue 7; Pages: 1019
The use of focused ion and focused electron beam (FIB/FEB) technology permits the fabrication of micro- and nanometer scale geometries. Therefore, FIB/FEB technology is a favorable technique for preparing TEM lamellae, nanocontacts, or nanowires and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=multidiscipl::9f3ab1b86e3c4154cb1b14f15ab2a748
Publikováno v:
Applied Sciences; Volume 11; Issue 24; Pages: 11793
To realize quantum tunneling applications with movable electrodes, sharp tips with radii down to several tens of nanometers are necessary. The use of a focused ion beam (FIB) and focused electron beam (FEB) with a gas injection system (GIS) allows th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=multidiscipl::2f79f9f0fe809371e944805e5cc7af4c