Impact of leakage current on data retention of RF-powered devices during amplitude-modulation-based communication.

Autor: Haid, Josef, Zimek, Bernd, Leutgeb, Thomas, Künemund, Thomas

Publikováno v: Proceedings of the Conference: Design, Automation & Test in Europe (9783981080131); 3/10/2008, p784-787, 4p