Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Zikun Ding"'
Publikováno v:
Applied Sciences, Vol 12, Iss 9, p 4748 (2022)
Electrochemical migration (ECM) of sintered nano-Ag could be a serious reliability concern for power devices with high-density packaging. An anti-ECM nano-Ag-SiOx paste was proposed by doping 0.1wt% SiOx nanoparticles rather than previously used expe
Externí odkaz:
https://doaj.org/article/c02d6c8d63584d09b26c164136b4c097
Publikováno v:
IEEE Transactions on Power Electronics. 35:8532-8539
High temperature application and long-term reliability are the future development trends of IGBT (insulated gate bipolar transistor) module. This article proposes a 1200-V/50-A IGBT module using the current-assisted sintered nanosilver as die attachm