Zobrazeno 1 - 10
of 66
pro vyhledávání: '"Zi Li Xie"'
Autor:
Fei-Fan Xu, Tao Tao, Bin Liu, Xuan Wang, Mao-Gao Gong, Ting Zhi, Dan-Feng Pan, Zi-Li Xie, Yu-Gang Zhou, You-Dou Zheng, Rong Zhang
Publikováno v:
IEEE Photonics Journal, Vol 12, Iss 1, Pp 1-7 (2020)
Semi-polar micro-LEDs have gain increasing interests due to the advantages of polarization control and quantum efficiency improvement. In this work, a novel semi-polar (20-21)-plane micro-LEDs array has been designed and manufactured. In comparison w
Externí odkaz:
https://doaj.org/article/514823165d68408bb8e3c2c1ab163f7c
Publikováno v:
Microwave and Optical Technology Letters. 57:2774-2778
An InGaAs/InP three mesa double heterojunction bipolar transistor demonstrating ft/fmax of 350/532 GHz was fabricated on 3 inch wafer with a 0.5 μm emitter and a composite collector. Base resistance Rbb of around 19 Ω was achieved to sustain a rela
Autor:
L. Yu, Zi Li Xie, Xiang Qian Xiu, Jing Ping Dai, Li Qun Hu, Ping Han, Hong Zhao, Chen Peng, Cai Chuan Wu, Xiao Long He, Bin Liu, Shu Fan, Xue Fei Li, Dunjun Chen, Youdou Zheng, Xue Mei Hua, Rong Zhang
Publikováno v:
Advanced Materials Research. :391-395
The AlN nucleation layer (NL) has been deposited on Si (111) substrate by metal-organic chemical vapor deposition (MOCVD). The result indicates that the growth mode of the AlN NL is in the form of 2-dimensional plane and 3-dimensional island. The pro
Publikováno v:
Advanced Materials Research. :442-445
Heavily P type In0.51Ga0.49As was grown with hole concentration from 3.3E19cm-3 to 4.6E19cm-3. Standard (001) surface Raman backscattering geometry was used to measure samples. Two mode behavior and LO phonon-plasmon-coupled mode (LOPC) were observed
Autor:
F. Yu, Li Hong Cheng, Hong Zhao, Youdou Zheng, L. Yu, Xiang Qian Xiu, Z.Z. Lu, Zi Li Xie, Rui Zhang, Xiang Fu Zhao, Ping Han
Publikováno v:
Advanced Materials Research. :1568-1572
The Ge mole fraction (x) of Si1-xGexlayer was described by the C-V technique for Schottkey contact of single heterojunction Si1-xGex/Si, whose structure profile can be characterized by SEM image and EDS. Then the strained Si cap layer was grown on th
Publikováno v:
IEEE Transactions on Consumer Electronics. 57:153-159
In this paper we design and implement a home embedded surveillance system with ultra-low alert power. Traditional surveillance systems suffer from an unnecessary waste of power and the shortcomings of memory conditions in the absence of invasion. In
Publikováno v:
IEEE Journal of Quantum Electronics. 45:575-578
AlGaN-based resonant-cavity-enhanced (RCE) p-i-n photodetectors (PDs) for operating at the wavelength of 330 nm were designed and fabricated. A 20.5-pair AlN/Al0.3Ga0.7N distributed Bragg reflector (DBR) was used as the back mirror and a 3-pair AlN/A
Publikováno v:
Materials Science Forum. :3753-3756
Fe films have been grown on different oriented Si substrates by metal organic chemical vapor deposition (MOCVD), and then samples are put in the air without any protection for nearly fifteen years. In this paper, using methods such as X-ray diffracti
Publikováno v:
Materials Science Forum. :3717-3720
The MOCVD-growth and annealing of InN films have been studied in this work. The XRD spectra of InN films grown at 350 °C~500 °C indicate that the diffraction of In increases with increasing the growth temperature to 425 °C and the temperature high
Autor:
Rong Zhang, S.L. Gu, Youdou Zheng, Huiqiang Yu, Zi Li Xie, Y.D. Ye, Yi Shi, Ben Shen, Lin Chen, Xiang Qian Xiu
Publikováno v:
Materials Science Forum. :3783-3786
GaN films are grown on Si(111) with low-temperature GaN (LT-GaN) layers as buffer layers by hydride vapor phase epitaxy (HVPE). The LT-GaN layers are deposited at different temperatures ranging from 400 to 900 °C. The surface property, the structure