Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Zhukov RN"'
Autor:
Turutin AV; Laboratory of Physics of Oxide Ferroelectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia.; Department of Physics and I3N, University of Aveiro, 3810-193 Aveiro, Portugal., Skryleva EA; Laboratory of Physics of Oxide Ferroelectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia., Kubasov IV; Laboratory of Physics of Oxide Ferroelectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia., Milovich FO; Laboratory of Physics of Oxide Ferroelectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia., Temirov AA; Laboratory of Physics of Oxide Ferroelectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia., Raketov KV; Laboratory of Physics of Oxide Ferroelectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia.; Mapper LLC, Volgogradsky Pr. 42 k. 5, 109316 Moscow, Russia., Kislyuk AM; Laboratory of Physics of Oxide Ferroelectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia., Zhukov RN; Laboratory of Physics of Oxide Ferroelectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia., Senatulin BR; Laboratory of Physics of Oxide Ferroelectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia., Kuts VV; Laboratory of Physics of Oxide Ferroelectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia., Malinkovich MD; Laboratory of Physics of Oxide Ferroelectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia., Parkhomenko YN; Laboratory of Physics of Oxide Ferroelectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia.; JSC ''Giredmet'', 2 Elektrodnaya Str., 111524 Moscow, Russia., Sobolev NA; Laboratory of Physics of Oxide Ferroelectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia.; Department of Physics and I3N, University of Aveiro, 3810-193 Aveiro, Portugal.
Publikováno v:
Materials (Basel, Switzerland) [Materials (Basel)] 2023 Jan 04; Vol. 16 (2). Date of Electronic Publication: 2023 Jan 04.
Autor:
Kubasov IV; Department of the Materials Science of Semiconductors and Dielectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia. kubasov.ilya@gmail.com., Kislyuk AM; Department of the Materials Science of Semiconductors and Dielectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia. akislyuk94@gmail.com., Turutin AV; Department of the Materials Science of Semiconductors and Dielectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia. aturutin92@gmail.com.; Department of Physics and I3N, University of Aveiro, 3810-193 Aveiro, Portugal. aturutin92@gmail.com., Bykov AS; Department of the Materials Science of Semiconductors and Dielectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia. xalexx1349@mail.ru., Kiselev DA; Department of the Materials Science of Semiconductors and Dielectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia. dm.kiselev@gmail.com., Temirov AA; Department of the Materials Science of Semiconductors and Dielectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia. temirov.alex@yandex.ru., Zhukov RN; Department of the Materials Science of Semiconductors and Dielectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia. rom_zhuk@mail.ru., Sobolev NA; Department of the Materials Science of Semiconductors and Dielectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia. sobolev@ua.pt.; Department of Physics and I3N, University of Aveiro, 3810-193 Aveiro, Portugal. sobolev@ua.pt., Malinkovich MD; Department of the Materials Science of Semiconductors and Dielectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia. malinkovich@yandex.ru., Parkhomenko YN; Department of the Materials Science of Semiconductors and Dielectrics, National University of Science and Technology MISiS, 119049 Moscow, Russia. parkh@rambler.ru.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2019 Feb 01; Vol. 19 (3). Date of Electronic Publication: 2019 Feb 01.