Significance of matrix diagonalization in modelling inelastic electron scattering

Autor: Ute Kaiser, Ralf Hambach, Zhongbo Lee, Harald Rose

Publikováno v: Ultramicroscopy. 175:58-66

Electron scattering is always applied as one of the routines to investigate nanostructures. Nowadays the development of hardware offers more and more prospect for this technique. For example imaging nanostructures with inelastic scattered electrons m

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::735141b4000b68736c4c36d9e9843d33
https://doi.org/10.1016/j.ultramic.2016.11.011

Efficient first principles simulation of electron scattering factors for transmission electron microscopy

Autor: Timothy J. Pennycook, Jani Kotakoski, Toma Susi, Ursula Ludacka, Zhongbo Lee, Jens Jørgen Mortensen, Jacob Madsen, Ute Kaiser, Jannik C. Meyer

Publikováno v: Susi, T, Madsen, J, Ludacka, U, Mortensen, J J, Pennycook, T J, Lee, Z, Kotakoski, J, Kaiser, U & Meyer, J C 2019, ' Efficient first principles simulation of electron scattering factors for transmission electron microscopy ', Ultramicroscopy, vol. 197, pp. 16-22 . https://doi.org/10.1016/j.ultramic.2018.11.002
Ultramicroscopy

Electron microscopy is a powerful tool for studying the properties of materials down to their atomic structure. In many cases, the quantitative interpretation of images requires simulations based on atomistic structure models. These typically use the

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9b07300f52e1029f4bf0d1f7996685aa
https://orbit.dtu.dk/en/publications/b08bb64e-cea0-4bb8-b371-6316da3d305e

Comparison of different imaging models handling partial coherence for aberration-corrected HRTEM at 40-80 kV

Autor: Ute Kaiser, Zhongbo Lee, Tibor Lehnert, Harald Rose

Publikováno v: Ultramicroscopy. 203

Partial coherence of the electron waves leaving the specimen is taken into account in the high-resolution transmission electron microscopy (HRTEM) image simulation by mainly three methods - the incoherent summation approach, the transmission cross-co

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fd6f399f910fc3573a53605cc805357b
https://pubmed.ncbi.nlm.nih.gov/30773417

Engineering the Contrast Transfer through the Cc/Cs Corrected 20-80 kVSALVE Microscope

Autor: Felix Börrnert, Johannes Biskupek, Zhongbo Lee, Martin Linck, Peter Hartel, Heiko Müller, Maximilian Haider, Ute Kaiser

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::874b4af835cb559958d343dffc362b66
https://doi.org/10.1002/9783527808465.emc2016.5448

Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV

Autor: Zhongbo Lee, Martin Linck, Frank Kahl, Ute Kaiser, Johannes Biskupek, Maarten Bischoff, Harald Rose, Marcel Niestadt, Stephan Uhlemann, Max Haider, J. Zach, Tibor Lehnert, Heiko Müller, Felix Börrnert, Peter Hartel

Publikováno v: Physical review letters. 117(7)

Atomic resolution in transmission electron microscopy of thin and light-atom materials requires a rigorous reduction of the beam energy to reduce knockon damage. However, at the same time, the chromatic aberration deteriorates the resolution of the T

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aa6993c044f11059b06fee9433259dbb
https://pubmed.ncbi.nlm.nih.gov/27563976