Zobrazeno 1 - 10
of 125
pro vyhledávání: '"Zhitenev NB"'
Autor:
Slot MR; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Department of Physics, Georgetown University, Washington, DC 20007, USA., Maximenko Y; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Department of Chemistry and Biochemistry, University of Maryland, College Park, MD 20742, USA., Haney PM; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Kim S; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Joint Quantum Institute, Department of Physics, University of Maryland, College Park, MD 20742, USA., Walkup DT; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Strelcov E; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Department of Chemistry and Biochemistry, University of Maryland, College Park, MD 20742, USA., Le ST; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Shih EM; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Department of Chemistry and Biochemistry, University of Maryland, College Park, MD 20742, USA., Yildiz D; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Joint Quantum Institute, Department of Physics, University of Maryland, College Park, MD 20742, USA., Blankenship SR; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Watanabe K; Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan., Taniguchi T; International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan., Barlas Y; Department of Physics, University of Nevada, Reno, NV 89557, USA., Zhitenev NB; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Ghahari F; Department of Physics and Astronomy, George Mason University, Fairfax, VA 22030, USA., Stroscio JA; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Publikováno v:
Science (New York, N.Y.) [Science] 2023 Oct 06; Vol. 382 (6666), pp. 81-87. Date of Electronic Publication: 2023 Oct 05.
Autor:
Walkup D; National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA., Zhitenev NB; National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA. nikolai.zhitenev@nist.gov.
Publikováno v:
Nature nanotechnology [Nat Nanotechnol] 2023 Mar; Vol. 18 (3), pp. 219-220.
Autor:
Kim S; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, MD, USA., Schwenk J; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, MD, USA., Walkup D; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, MD, USA., Zeng Y; Department of Physics, Columbia University, New York, NY, USA., Ghahari F; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, MD, USA., Le ST; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Theiss Research, La Jolla, CA, USA., Slot MR; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.; Department of Physics, Georgetown University, Washington, DC, USA., Berwanger J; Institute of Experimental and Applied Physics, University of Regensburg, Regensburg, Germany., Blankenship SR; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA., Watanabe K; Research Center for Functional Materials, National Institute for Materials Science, Tsukuba, Ibaraki, Japan., Taniguchi T; International Center for Materials Nanoarchitectonics, National Institute for Materials Science, Tsukuba, Ibaraki, Japan., Giessibl FJ; Institute of Experimental and Applied Physics, University of Regensburg, Regensburg, Germany., Zhitenev NB; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA., Dean CR; Department of Physics, Columbia University, New York, NY, USA. cdean@phys.columbia.edu., Stroscio JA; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA. joseph.stroscio@nist.gov.
Publikováno v:
Nature communications [Nat Commun] 2021 May 14; Vol. 12 (1), pp. 2852. Date of Electronic Publication: 2021 May 14.
Autor:
Strelcov E; Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.; Maryland NanoCenter , University of Maryland , College Park , Maryland 20742 , United States., Arble C; Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States., Guo H; SEU-FEI Nano-Pico Center, Key Laboratory of MEMS of Ministry of Education , Southeast University , Nanjing 210096 , China., Hoskins BD; Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States., Yulaev A; Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.; Department of Chemistry and Biochemistry , University of Maryland , College Park , Maryland 20742 , United States., Vlassiouk IV; Oak Ridge National Laboratory , Oak Ridge , Tennessee 37830 , United States., Zhitenev NB; Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States., Tselev A; Department of Physics and CICECO-Aveiro Institute of Materials , University of Aveiro , 3810-193 Aveiro , Portugal., Kolmakov A; Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.
Publikováno v:
Nano letters [Nano Lett] 2020 Feb 12; Vol. 20 (2), pp. 1336-1344. Date of Electronic Publication: 2020 Jan 31.
Autor:
Walkup D; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Maryland NanoCenter, University of Maryland, College Park, Maryland 20742, USA., Ghahari F; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Maryland NanoCenter, University of Maryland, College Park, Maryland 20742, USA., Gutiérrez C; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Maryland NanoCenter, University of Maryland, College Park, Maryland 20742, USA., Watanabe K; National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan., Taniguchi T; National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan., Zhitenev NB; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Stroscio JA; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
Publikováno v:
Physical review. B [Phys Rev B] 2020; Vol. 101 (3).
Autor:
Yoon Y; Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.; Maryland NanoCenter , University of Maryland , College Park , Maryland 20742 , United States., Yang WD; Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.; Maryland NanoCenter , University of Maryland , College Park , Maryland 20742 , United States., Ha D; Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.; Maryland NanoCenter , University of Maryland , College Park , Maryland 20742 , United States., Haney PM; Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States., Hirsch D; Fraunhofer Institute for Organic Electronics , Electron Beam and Plasma Technology FEP , Winterbergstrasse 28 , 01277 Dresden , Germany., Yoon HP; Department of Electrical and Computer Engineering , University of Utah , Salt Lake City , Utah 84112 , United States., Sharma R; Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States., Zhitenev NB; Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2019 Dec 18; Vol. 11 (50), pp. 47037-47046. Date of Electronic Publication: 2019 Dec 04.
Autor:
McGehee WR; National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States., Strelcov E; National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.; Maryland NanoCenter , University of Maryland , College Park , Maryland 20742 , United States., Oleshko VP; National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States., Soles C; National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States., Zhitenev NB; National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States., McClelland JJ; National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.
Publikováno v:
ACS nano [ACS Nano] 2019 Jul 23; Vol. 13 (7), pp. 8012-8022. Date of Electronic Publication: 2019 Jul 10.
Autor:
Gutiérrez C; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA., Walkup D; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA., Ghahari F; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA., Lewandowski C; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139, USA., Rodriguez-Nieva JF; Department of Physics, Harvard University, Cambridge, MA 02138, USA., Watanabe K; National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan., Taniguchi T; National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan., Levitov LS; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139, USA., Zhitenev NB; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Stroscio JA; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA. joseph.stroscio@nist.gov.
Publikováno v:
Science (New York, N.Y.) [Science] 2018 Aug 24; Vol. 361 (6404), pp. 789-794.
Autor:
Ha D; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland, 20899, United States of America. Maryland Nanocenter, University of Maryland, College Park, Maryland, 20742, United States of America., Yoon Y, Zhitenev NB
Publikováno v:
Nanotechnology [Nanotechnology] 2018 Apr 06; Vol. 29 (14), pp. 145401.
Autor:
Ha D; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland, 20899, USA., Zhitenev NB; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland, 20899, USA.
Publikováno v:
Particle & particle systems characterization : measurement and description of particle properties and behavior in powders and other disperse systems [Part Part Syst Charact] 2018; Vol. 35.