Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Zhi Li Dong"'
Publikováno v:
AIP Advances, Vol 8, Iss 11, Pp 115327-115327-11 (2018)
By in-situ transmission electron microscopy (TEM), we performed a detailed study on the electron-beam radiation damage to nanostructured silicon nitride thin-film process layers in a typical semiconductor NVM device. It was found that high-dose elect
Externí odkaz:
https://doaj.org/article/6f56e835d12142789c42c12c8151ced4
Publikováno v:
In Electrochemistry Communications 2007 9(5):1233-1238
Publikováno v:
IEEE Transactions on Electron Devices; Aug2010, Vol. 57 Issue 8, p1948-1952, 5p
Publikováno v:
Applied Physics A: Materials Science & Processing; Jan2010, Vol. 98 Issue 1, p91-96, 6p, 4 Diagrams
Autor:
Qin Jia Cai, Ye Gan, Mary B Chan-Park, Hong Bin Yang, Zhi Song Lu, Chang Ming Li, Jun Guo, Zhi Li Dong
Publikováno v:
Chemistry of Materials; Jul2009, Vol. 21 Issue 14, p3153-3161, 9p
Publikováno v:
Langmuir; Oct2008, Vol. 24 Issue 22, p13197-13202, 6p
Publikováno v:
Journal of Physical Chemistry B; Aug2008, Vol. 112 Issue 39, p12270-12278, 9p
Autor:
Bo Ling, Jun Liang Zhao, Xiao Wei Sun, Swee Tiam Tan, Aung Ko Ko Kyaw, Divayana, Yoga, Zhi Li Dong
Publikováno v:
Applied Physics Letters; 7/5/2010, Vol. 97 Issue 1, p013101, 3p, 1 Diagram, 3 Graphs
Autor:
Qin Jia Cai, Ye Gan, Chan-Park, Mary B., Hong Bin Yang, Zhi Song Lu, Qun Liang Song, Chang Ming Li, Zhi Li Dong
Publikováno v:
Applied Physics Letters; 9/15/2008, Vol. 93 Issue 11, p113304, 3p, 1 Color Photograph, 1 Diagram, 2 Graphs