Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Zhenxue Han"'
Publikováno v:
Surface Innovations. :1-11
Large Leidenfrost drops may be unstable when their diameters exceed a critical value. Through theoretical and experimental investigations, this study explored the feasibility of suppressing Leidenfrost instability in a large container, by meshing the
Publikováno v:
Surface Innovations. :1-12
Leidenfrost drops have demonstrated promising applications in, for example, drag reduction. However, large Leidenfrost drops may be unstable when their diameters exceed a critical value, leading to less control of such drops in their applications. In
Publikováno v:
Microelectronics Reliability. 44:1977-1983
In this study, a simulation-based multi-objective design optimization methodology was developed for improving electronic packaging reliability. It was demonstrated using a generic model of an electronic package on a printed wiring board. The objectiv
Autor:
Dennis, B.H., Zhenxue Han, Weiya Jin, Bo Ping Wang, Leon Xu, Aapro, T., Ptchelintsev, A., Reinikainen, T.
Publikováno v:
EuroSime 2006 - 7th International Conference on Thermal, Mechanical & Multiphysics Simulation & Experiments in Micro-Electronics & Micro-Systems; 2006, p1-5, 5p
Publikováno v:
ITherm 2002. Eighth Intersociety Conference on Thermal & Thermomechanical Phenomena in Electronic Systems (Cat. No.02CH37258); 2002, p926-931, 6p
Publikováno v:
ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.02CH37258).
Stress analysis of a two-layer wire bonded plastic ball grid array (WB-PBGA) package has been carried out to study the effect of adhesively bonded heat sink. A three dimensional finite element model of the WB-PBGA package and the printed wiring board
Publikováno v:
Natural Gas Industry; 2023, Vol. 43 Issue 11, p83-99, 17p
Publikováno v:
Coal Science & Technology (0253-2336); May2023, Vol. 51 Issue 5, p140-148, 9p
Publikováno v:
Natural Gas Industry; 2021, Vol. 41 Issue 1, p15-28, 14p
Publikováno v:
Proceedings of the 5th International Conference on Thermal & Mechanical Simulation & Experiments in Microelectronics & Microsystems, 2004. EuroSimE 2004; 2004, p210-210, 1p