Zobrazeno 1 - 10
of 40
pro vyhledávání: '"Zhenxin Zhong"'
Publikováno v:
Energies, Vol 17, Iss 18, p 4568 (2024)
Distribution lines are an important component of a power system. Lightning disasters have serious adverse effects on the reliability of the power supply in distribution networks. In response to the current lack of research on lightning protection in
Externí odkaz:
https://doaj.org/article/b4a5f4d45e8b477da39635424487cb2b
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c21afbd280aa44721aae1b4aa2cfd7be
https://doi.org/10.1117/12.2658795
https://doi.org/10.1117/12.2658795
Publikováno v:
Lecture Notes in Electrical Engineering ISBN: 9789819904075
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c2a751c3132653b9cb8dfd113fc596dc
https://doi.org/10.1007/978-981-99-0408-2_122
https://doi.org/10.1007/978-981-99-0408-2_122
Publikováno v:
2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9db025c5a30a4582e6c571a6ec815eff
https://doi.org/10.1109/ipfa53173.2021.9617426
https://doi.org/10.1109/ipfa53173.2021.9617426
Publikováno v:
International Journal of Power and Energy Conversion. 1:1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4ed45514b592d7f419cfda88c7b91ea6
https://doi.org/10.1504/ijpec.2022.10052105
https://doi.org/10.1504/ijpec.2022.10052105
Publikováno v:
2018 China International Conference on Electricity Distribution (CICED).
With the power electronic devices densely connected to the power grid, it is easy to make the interharmonic which is close to the harmonic appear in the power system signals. When the frequency of interharmonic is close to that of harmonic, the spect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3c63ea77986d18fa29477ccaa7c4f587
https://doi.org/10.1109/ciced.2018.8592578
https://doi.org/10.1109/ciced.2018.8592578
Publikováno v:
2018 China International Conference on Electricity Distribution (CICED).
The wind farm side harmonic impedance could not be neglected when assessing the wind farm harmonic emission level. Because of the low impedance characteristic of the wind turbine filter. This paper presents a new method to estimate the wind farm harm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7016e4a85473af3e8cd7a319f2fbd411
https://doi.org/10.1109/ciced.2018.8592238
https://doi.org/10.1109/ciced.2018.8592238
Autor:
John Fretwell, Haiyan Tan, Chris Hakala, Timothy A. Johnson, Raghaw Rai, Irene Brooks, Chris Kang, Ahmad Katnani, Laurent Dumas, Yinggang Lu, Weihao Weng, Zhenxin Zhong
Publikováno v:
2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
Developments in the semiconductor industry are driving the need for new methods to characterize smaller 3D devices in a productive and reproducible way. The automation of sample preparation, TEM imaging, and offline CD metrology is able to provide sa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b91e8d8f026942d1806756a3776c3069
https://doi.org/10.1109/asmc.2018.8373156
https://doi.org/10.1109/asmc.2018.8373156
Autor:
Jack Hager, Laurent Dumas, John Fretwell, Yinggang Lu, Haiyan Tan, Weihao Weng, Anne Kenslea, Chris Kang, Chris Hakala, Zhenxin Zhong, Irene Brooks
Publikováno v:
2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
Few existing in-line CD metrology techniques can match the sub-surface 3D analytical capability provided by transmission electron microscopy (TEM). Recent developments in sample preparation and analysis have resulted in a fully automated TEM workflow
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::453c2d36e3d85f821b1385b7985d0142
https://doi.org/10.1109/asmc.2018.8373170
https://doi.org/10.1109/asmc.2018.8373170
Autor:
Oleksii Bidiuk, Ozan Ugurlu, Gavin Dutrow, Zhenxin Zhong, Martin Verheijen, Justin Roller, Jason Donald
Publikováno v:
Metrology, Inspection, and Process Control for Microlithography XXXII.
New materials and designs in complex 3D architectures in logic and memory devices have raised complexity in S/TEM metrology. In this paper, we report about a newly developed, automated, scanning transmission electron microscopy (STEM) based, energy d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6b8d8c2b178654449662d28555518485
https://doi.org/10.1117/12.2297403
https://doi.org/10.1117/12.2297403