Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Zhengyun Pan"'
Autor:
Guoqing Xu, Lingfeng Shao, Wei Feng, Wei Zhu, Zhengyun Pan, Changle Li, Yanhui Zhang, Lei Xia
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 72:1-10
Publikováno v:
2022 International Conference on Power Energy Systems and Applications (ICoPESA).
Publikováno v:
2021 8th International Conference on Electrical and Electronics Engineering (ICEEE).
Junction temperature is an important performance parameter for the operation of power semiconductor devices and it is also one of the main factors leading to device failure. This paper proposes a novel online method for monitoring the junction temper
Publikováno v:
IEEE Journal of Emerging and Selected Topics in Power Electronics. :1-1