Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Zhengqi Gao"'
Autor:
LIU Zhengqi, GAO Fuhai
Publikováno v:
Yuanzineng kexue jishu, Vol 58, Iss 4, Pp 848-855 (2024)
Division 5 of the ASME code section Ⅲ (referred to as ASME-Ⅲ-5) provides design-by-analysis methods and evaluation criteria for Class 1 nuclear components working at high temperatures. It has a long history and is the main international design co
Externí odkaz:
https://doaj.org/article/4d244041efa647cfbf4609e227c94d5c
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 42:360-370
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::936261866ba4c710db16ba84d907f16a
https://doi.org/10.1109/tcad.2022.3174170
https://doi.org/10.1109/tcad.2022.3174170
Publikováno v:
Journal of Lightwave Technology. :1-8
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::06ed2ff16e62bb738774373e9c54aaa4
https://doi.org/10.1109/jlt.2023.3271184
https://doi.org/10.1109/jlt.2023.3271184
Publikováno v:
Journal of Lightwave Technology. 40:7879-7892
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5644f12ebc3b48dad22396180e649eb9
https://doi.org/10.1109/jlt.2022.3207052
https://doi.org/10.1109/jlt.2022.3207052
Autor:
Ron Rohrer, Zhengqi Gao
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:1222-1235
Parametric yield estimation is a critical component in the Integrated Circuit design flow. We propose an efficient non-Monte-Carlo yield estimation method. Key is the use of sensitivity information efficiently obtained with the nominal circuit respon
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a108479dcfd4b6e71c079a4aebc8a9ee
https://doi.org/10.1109/tcad.2021.3079105
https://doi.org/10.1109/tcad.2021.3079105
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:789-793
In this paper, to accurately estimate the rare failure rates for large-scale circuits (e.g., SRAM) where process variations are modeled as truncated normal distributions in high-dimensional space, we propose a novel truncated scaled-sigma sampling (T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b9b85202e009f8bda136becb7366882b
https://doi.org/10.1109/tcad.2021.3068107
https://doi.org/10.1109/tcad.2021.3068107
Autor:
Zhengxing Zhang, Milica Notaros, Zhengqi Gao, Uttara Chakraborty, Jelena Notaros, Duane S. Boning
Publikováno v:
2023 Optical Fiber Communications Conference and Exhibition (OFC).
We consider the impact of spatially correlated geometric variations on splitter-tree-based integrated optical phased arrays. These variations can substantially affect the emitted beam. Our analysis is shown to be consistent with experimental results.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2ae198a6b6a0e12e658670377187182b
https://doi.org/10.23919/ofc49934.2023.10116917
https://doi.org/10.23919/ofc49934.2023.10116917
Data mixing (e.g., Mixup, Cutmix, ResizeMix) is an essential component for advancing recognition models. In this paper, we focus on studying its effectiveness in the self-supervised setting. By noticing the mixed images that share the same source ima
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8615d45573480d8bb8e1ca1a9f53b87e
http://arxiv.org/abs/2206.07692
http://arxiv.org/abs/2206.07692
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 39:2029-2041
In this article, we propose an efficient correlated Bayesian inference (CBI) method to estimate the system-level failure rates for large-scale circuit systems over multiple process corners. The key idea is to encode the correlations of circuit perfor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5493f2151b79ea2371fcaa3a5314bd59
https://doi.org/10.1109/tcad.2019.2949524
https://doi.org/10.1109/tcad.2019.2949524
Autor:
Zhengxing Zhang, Milica Notaros, Zhengqi Gao, Uttara Chakraborty, Jelena Notaros, Duane S. Boning
Publikováno v:
Optics Express. 31:12912
We consider the impact of intra-wafer systematic spatial variation, pattern density mismatch, and line edge roughness on splitter-tree-based integrated optical phased arrays. These variations can substantially affect the emitted beam profile in the a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ab33cdd4508920784785b8a9fd189cd
https://doi.org/10.1364/oe.487096
https://doi.org/10.1364/oe.487096