Zobrazeno 1 - 10
of 49
pro vyhledávání: '"Zhen‐Hong Zhou"'
Autor:
Junlan Yang, Hui Liu, Bo Yang, Shunchang Jiao, Liangliang Wu, Zhen-hong Zhou, Yi Hu, Zhikuan Wang
Publikováno v:
Cancer Immunology, Immunotherapy. 61:911-916
Expression levels of VEGF and Her-2, levels of T-regulatory (Treg) cells, levels of CD3+ cells, and ratios of Th (CD4+ T cells)/Tr (Treg) cells were compared between stage I, II, III, and IV breast cancer patients (n = 120) prior to chemotherapy and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6e6a7293325eba25b1c0973de341e85b
https://doi.org/10.1007/s00262-011-1158-4
https://doi.org/10.1007/s00262-011-1158-4
Publikováno v:
Journal of Biological Chemistry. 282:34381-34391
High-grade glioma cells express subunits of the ENaC/Deg superfamily, including members of ASIC subfamily. Our previous work has shown that glioma cells exhibit a basally active cation current, which is not present in low-grade tumor cells or normal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::89c0e7eeb5a35ce5e5b820e5e5f50e95
https://doi.org/10.1074/jbc.m705354200
https://doi.org/10.1074/jbc.m705354200
Autor:
G. Yancey Gillespie, Zhen Hong Zhou, Gergely Gy Kovacs, Wanda H. Vila-Carriles, James M. Markert, Garrett Colby, Timothy B. Mapstone, Ogenna Esimai, James K. Bubien, Biljana Jovov, Amit K. Pahwa, Dale J. Benos, Catherine M. Fuller
Publikováno v:
Journal of Biological Chemistry. 281:19220-19232
Gliomas are primary brain tumors with a complex biology characterized by antigenic and genomic heterogeneity and a propensity for invasion into normal brain tissue. High grade glioma cells possess a voltage-independent, amiloride-inhibitable, inward
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ebeb69b31234aa470d09aba714de922f
https://doi.org/10.1074/jbc.m603100200
https://doi.org/10.1074/jbc.m603100200
Autor:
Zhen-hong Zhou
Publikováno v:
Journal of Computer Applications. 31:815-817
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1af4ee12640f32a4a452221e831c5ebb
https://doi.org/10.3724/sp.j.1087.2011.00815
https://doi.org/10.3724/sp.j.1087.2011.00815
Autor:
Tian-Ming, Dong, Lin, Ma, Zhen-Hong, Zhou, Xian, Xu, Yan-Hua, Tang, Sui-Hui, Chen, Min, Chen, Ning-Yu, An
Publikováno v:
Zhonghua gan zang bing za zhi = Zhonghua ganzangbing zazhi = Chinese journal of hepatology. 22(2)
To evaluate the clinical value of magnetic resonance (MR) diffusion-weighted imaging (DWI) for diagnosing radiation-induced liver injury (RILI) and detecting changes in hepatic pathology at different post-irradiation times.Male New Zealand white rabb
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::189c43098257e1e9028a9ed2e17df435
https://pubmed.ncbi.nlm.nih.gov/24735596
https://pubmed.ncbi.nlm.nih.gov/24735596
Publikováno v:
World Journal of Surgical Oncology. 2013, Vol. 11 Issue 1, p1-3. 3p.
Publikováno v:
Thin Solid Films. 302:169-178
A defect-free silicon epitaxial layer was deposited by in-situ electron cyclotron resonance (ECR) hydrogen plasma cleaning at room temperature (25°C) in a multi-chamber chemical vapor deposition (MS-CVD) system with a load lock chamber. ECR hydrogen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fdefc16faaeeb9da0325bc891a6f08ce
https://doi.org/10.1016/s0040-6090(96)09548-x
https://doi.org/10.1016/s0040-6090(96)09548-x
Autor:
R. Reif, Zhen-Hong Zhou
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 8:340-345
Real-time in situ applications of the emission Fourier transform infrared (E/FT-IR) technique are reported in this paper. For real-time process monitoring, we found that the real-time growth rate measured by the E/FT-IR is responsive to variations of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::95974e959aa3019c6b6dfb6d5d774b42
https://doi.org/10.1109/66.401011
https://doi.org/10.1109/66.401011
Autor:
R. Reif, Zhen-Hong Zhou
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 8:333-339
This paper reports the measurement of epitaxial silicon film thickness using a Fourier transform infrared spectrometer. The implementation and characteristics of emission Fourier transform infrared spectroscopy (E/FT-IR) for film thickness measuremen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cd2a9c74daf17736619be56b11816263
https://doi.org/10.1109/66.401010
https://doi.org/10.1109/66.401010
Publikováno v:
Journal of Applied Physics. 76:2448-2454
Procedures and results of refractive index measurements using a Fourier transform infrared spectrometer are reported. These measurements were performed on both lightly and heavily doped silicon samples over the midinfrared (2.5–25 μm) spectrum reg
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::56540c5678ef275753fdf4edc9669f40
https://doi.org/10.1063/1.357595
https://doi.org/10.1063/1.357595