Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Zhaoshi Dong"'
Publikováno v:
Journal of Materials Engineering and Performance.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3ea18b2410a7c2d6b75ce6131cc50b8
https://doi.org/10.1007/s11665-023-07987-2
https://doi.org/10.1007/s11665-023-07987-2
Publikováno v:
Crystal Growth & Design. 20:6493-6501
Dynamic growth behaviors of nanotwinned Cu (nt-Cu) grain upon electron beam irradiation were investigated by in situ transmission electron microscopy. Direct evidence shows that nt-Cu grain grows i...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::43518e9e1e6409c659d905fdf8153bd7
https://doi.org/10.1021/acs.cgd.0c00651
https://doi.org/10.1021/acs.cgd.0c00651
Publikováno v:
Vacuum. 196:110711
The misfit dislocation at Ge/Si hetero-interface was quantitatively investigated by a combination of high-resolution transmission electron microscopy and geometric phase analysis. To describe the strain field around the misfit dislocation core at Ge/
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b036b3a11df49a0dcc61aa4710c939fb
https://doi.org/10.1016/j.vacuum.2021.110711
https://doi.org/10.1016/j.vacuum.2021.110711
Publikováno v:
Chemical Engineering Journal. 428:131193
Polyimide aerogels possess various applications in harsh environment but are often limited by poor mechanical property. The ice template method to construct a layered aerogel has structural advantages, but there are still problems of insufficient com
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7a4b7b2136105d1dffffb50b40a4684d
https://doi.org/10.1016/j.cej.2021.131193
https://doi.org/10.1016/j.cej.2021.131193
Publikováno v:
Modern Physics Letters B. 35:2150337
The Er-doped [Formula: see text] thin films with different Sn contents were prepared on Ge buffered Si substrates by thermal evaporation. The effect of Er doping on the crystallization of [Formula: see text] films at different annealing temperatures
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b1e7cd6141899ac09c9f37d582abac23
https://doi.org/10.1142/s0217984921503371
https://doi.org/10.1142/s0217984921503371
Publikováno v:
Physica B: Condensed Matter. 583:412039
High quality high-resolution transmission electron microscopy image was obtained from a dissociated 60° dislocation near a Ge/Si heterostructure interface. It is observed for the first time that the 60° dislocation dissociates differently from the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::141c4648549376cd03304525b953715d
https://doi.org/10.1016/j.physb.2020.412039
https://doi.org/10.1016/j.physb.2020.412039