Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Zhanhui Shi"'
Publikováno v:
IEEE Access, Vol 6, Pp 35683-35696 (2018)
The increase in the reliability requirements of integrated circuits applied in diverse smart sensing devices and the increase in the cost of test generation and fault simulation have expanded the need for new approaches to estimate signal reliability
Externí odkaz:
https://doaj.org/article/4b0488ddc5824b21b8780b8fe90bdc08
Publikováno v:
2022 IEEE 31st Asian Test Symposium (ATS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3bad8174b8c33a4958793b5f7198ea4
https://doi.org/10.1109/ats56056.2022.00014
https://doi.org/10.1109/ats56056.2022.00014