Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Zhangbao Peng"'
Autor:
Zhangbao Peng, Weijie Guo, Tingzhu Wu, Ziquan Guo, Yijun Lu, Yicheng Zheng, Yue Lin, Zhong Chen
Publikováno v:
IEEE Photonics Journal, Vol 12, Iss 1, Pp 1-8 (2020)
We investigate temperature-dependent carrier transfer and efficiency droop on AlGaN-based deep ultraviolet light-emitting diodes. The Shockley-Read-Hall (SRH) recombination and carrier leakage are highly associated with the poor thermal stability. Th
Externí odkaz:
https://doaj.org/article/b8ee46a5c3964e51aa607303569634a8
Autor:
Zhangbao Peng, Yijun Lu, Yulin Gao, Guolong Chen, Jianfei Zheng, Ziquan Guo, Yue Lin, Zhong Chen
Publikováno v:
IEEE Photonics Journal, Vol 10, Iss 6, Pp 1-8 (2018)
We investigate divergent behaviors in the emission of blue and green light-emitting diodes (LEDs) when they are subjected to the current-stress aging. Microscopic hyperspectral imaging is introduced to measure spatially resolved mappings of the peak
Externí odkaz:
https://doaj.org/article/66953e87514e42679ca9eef5b0a6d546
Autor:
Zhangbao Peng, Ziquan Guo, Tingzhu Wu, Peng Zhuang, Zhicheng Ye, Yuan Shi, Tien-Mo Shih, Yijun Lu, Hao-Chung Kuo, Zhong Chen
Publikováno v:
Applied Sciences, Vol 8, Iss 4, p 610 (2018)
We have experimentally analyzed multi-azimuth degradation mechanisms that govern failures of commercially-available high-power (1 Watt) phosphor-coated white (hppc-W) light-emitting diodes (LEDs) covered with peanut-shaped lenses under three current-
Externí odkaz:
https://doaj.org/article/6d8521f4547a475d8ea6c5785a0dc625
Autor:
Zhong Chen, Yi-Cheng Zheng, Yue Lin, Weijie Guo, Zhangbao Peng, Yijun Lu, Ziquan Guo, Tingzhu Wu
Publikováno v:
IEEE Photonics Journal, Vol 12, Iss 1, Pp 1-8 (2020)
We investigate temperature-dependent carrier transfer and efficiency droop on AlGaN-based deep ultraviolet light-emitting diodes. The Shockley-Read-Hall (SRH) recombination and carrier leakage are highly associated with the poor thermal stability. Th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bdebdad61d153a0c242dc8c6ba6dd0ad
https://ieeexplore.ieee.org/document/8928508/
https://ieeexplore.ieee.org/document/8928508/
Autor:
Yue Lin, Changwen Su, Zhangbao Peng, Hao Lu, Weijie Guo, Tingzhu Wu, Zhijie Ke, Zhong Chen, Yijun Lu
Publikováno v:
IEEE Electron Device Letters. 40:1132-1135
Spatially resolved electroluminescence emitted through the sapphire substrate of GaN-based flip-chip green microscale light-emitting diodes with $20\times 20\,\,\mu \text{m}^{\text {2}}$ mesas has been collected via microscopic hyperspectral imaging.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::51d8b6d5c819de5887551a191222a90f
https://doi.org/10.1109/led.2019.2915023
https://doi.org/10.1109/led.2019.2915023
Autor:
Zhong Chen, Weijie Guo, Chih Hao Lin, Chen Guolong, Tingzhu Wu, Lili Zheng, Yue Lin, Hao Lu, Zhangbao Peng, Changwen Su, Hao-Chung Kuo, Yijun Lu, Nan Chen
Publikováno v:
IEEE Transactions on Electron Devices. 66:2263-2268
Color gamut is of the paramount importance in the display. Light–current–voltage ( $L-I-V$ ) characteristics of red, green, and blue flip-chip mini-light-emitting diodes (LEDs) ( $100\,\,\mu \text{m}\,\,\times 200\,\,\mu \text{m}$ ) are investiga
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::08dcff03be7ff4c40938501ef03ce101
https://doi.org/10.1109/ted.2019.2906321
https://doi.org/10.1109/ted.2019.2906321
Autor:
Yulin Gao, Yijun Lu, Zhangbao Peng, Chen Guolong, Jianfei Zheng, Ziquan Guo, Zhong Chen, Yue Lin
Publikováno v:
IEEE Photonics Journal, Vol 10, Iss 6, Pp 1-8 (2018)
We investigate divergent behaviors in the emission of blue and green light-emitting diodes (LEDs) when they are subjected to the current-stress aging. Microscopic hyperspectral imaging is introduced to measure spatially resolved mappings of the peak
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::afa2b52901b7d2d660afc4d73887f3ca
https://ieeexplore.ieee.org/document/8528335/
https://ieeexplore.ieee.org/document/8528335/
Autor:
Zhicheng Ye, Ziquan Guo, Zhangbao Peng, Yijun Lu, Hao-Chung Kuo, Tien Mo Shih, Zhong Chen, Yuan Shi, Tingzhu Wu, Peng Zhuang
Publikováno v:
Applied Sciences; Volume 8; Issue 4; Pages: 610
Applied Sciences, Vol 8, Iss 4, p 610 (2018)
Applied Sciences, Vol 8, Iss 4, p 610 (2018)
We have experimentally analyzed multi-azimuth degradation mechanisms that govern failures of commercially-available high-power (1 Watt) phosphor-coated white (hppc-W) light-emitting diodes (LEDs) covered with peanut-shaped lenses under three current-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::618f380c17cb7cdff5685a360068864a
Autor:
Ziquan Guo, Yijun Lu, Peng Zhuang, Hao-Chung Kuo, Zhong Chen, Yuan Shi, Tingzhu Wu, Tien-Mo Shih, Zhangbao Peng
We have experimentally analyzed multi-azimuth degradation mechanisms that govern failures of commercially-available high-power (1 Watt) phosphor-coated white (hppc-W) light-emitting diodes (LEDs) covered with peanut-shaped lens under three current-st
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f4760cda542e8b27b9f0cdce314b567f
Publikováno v:
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XXII.
We adapt the hyperspectral imaging technique for detecting the spatially-resolved electroluminescence of GaNbased light-emitting diodes. Featuring a hyperspectral camera and a microscope, this microscopic-hyperspectral imaging (MHI) capture the image
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6e4b26e411b2e441c5e07e61b7d0407b
https://doi.org/10.1117/12.2281120
https://doi.org/10.1117/12.2281120