Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Zhang, Liju"'
Autor:
Liu, Weijun, Zhang, Zhenyong, Zhang, Liju, Jiang, Xiaoming, Chen, Changxian, Wu, Xi, Zhao, Quan
Publikováno v:
In Heliyon 15 May 2024 10(9)
Autor:
Guo, Congcong, Zhang, Liju, Nie, Lihong, Zhang, Na, Xiao, Di, Ye, Xingguang, Ou, Meiling, Liu, Yang, Zhang, Baohuan, Wang, Man, Lin, Hansheng, Yang, Guang, Jing, Chunxia
Publikováno v:
In Molecular and Cellular Endocrinology 5 July 2016 429:114-119
Akademický článek
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Autor:
ZHOU Mingfang, ZHANG Liju
Publikováno v:
Linchuang Gandanbing Zazhi, Vol 32, Iss 10, Pp 1853-1857 (2016)
Autor:
Xun, Huaizhu, Li, Hu, Li, Shujuan, Wei, Shujun, Zhang, Lijuan, Song, Fan, Jiang, Pei, Yang, Hailin, Han, Fei, Cai, Wanzhi
The plant bug, Nesidiocoris tenuis (Hemiptera: Miridae), is one of the most thermophilous dicyphines in agroecosystems and is widely distributed in China. Little is known regarding the genetic structure of N. tenuis and the effect of historical clima
Externí odkaz:
http://hdl.handle.net/10150/614987
http://arizona.openrepository.com/arizona/handle/10150/614987
http://arizona.openrepository.com/arizona/handle/10150/614987
Autor:
Vojnar, Tomáš, Zhang, Lijun
This book is Open Access under a CC BY licence. The LNCS 11427 and 11428 proceedings set constitutes the proceedings of the 25th International Conference on Tools and Algorithms for the Construction and Analysis of Systems, TACAS 2019, which took pla
Externí odkaz:
http://library.oapen.org/handle/20.500.12657/23328
Autor:
Zhang, Lijun
In light of the energy shortage and environmental pollution, improving the energy efficiency of energyintensive industrial processes is a research topic of increasing importance. The mining industry is one such heavy energy user. In particular, pumpi
Externí odkaz:
http://hdl.handle.net/2263/57513
Autor:
Zhang, Lijuan
La gestion d’une plate-forme selon une stratégie de cross dock est un processus logistique efficace et dynamique qui vise à transférer directement les produits d'un fournisseur à un client. Cette thèse aborde les problèmes d'affectation aux p
Externí odkaz:
http://www.theses.fr/2016ECLI0005/document
Autor:
Zhang, Lijuan, 1979
Electromigration (EM) remains a major reliability concern for on-chip Cu interconnects due to the continuing scaling and the introduction of new materials and processes. In Cu interconnects, the atomic diffusion along the Cu/SiCN cap interface domina
Externí odkaz:
http://hdl.handle.net/2152/ETD-UT-2010-12-2136
Autor:
Zhang, Lijun.
Thesis (Ph. D.)--University of Toronto, 2008.
Includes bibliographical references.
Includes bibliographical references.
Externí odkaz:
http://proquest.umi.com/pqdlink?did=1659883251&sid=7&Fmt=2&clientId=12520&RQT=309&VName=PQD