Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Zexiao Liang"'
Publikováno v:
Applied Sciences, Vol 14, Iss 12, p 5342 (2024)
With the increasing demand for high-resolution images, handling high-dimensional image data has become a key aspect of intelligence algorithms. One effective approach is to preserve the high-dimensional manifold structure of the data and find the acc
Externí odkaz:
https://doaj.org/article/dfaf103306e64b1ba84e9b13311c906a
Publikováno v:
IET Image Processing, Vol 15, Iss 10, Pp 2240-2246 (2021)
Abstract Spectral clustering is one of the most widely used technologies for clustering tasks, which represents data as a weighted graph, and aims to find an appropriate way to cut the graph apart in order to categorize the raw data. The pivotal step
Externí odkaz:
https://doaj.org/article/347413981e334760b4e19de237fd1d79
Publikováno v:
Applied Sciences, Vol 13, Iss 1, p 155 (2022)
With the vigorous development of integrated circuit (IC) manufacturing, the harmfulness of defects and hardware Trojans is also rising. Therefore, chip verification becomes more and more important. At present, the accuracy of most existing chip verif
Externí odkaz:
https://doaj.org/article/5e2d1296b4264d80a3743b28c1edbb9e
Publikováno v:
Pattern Recognition Letters. 171:61-68
Publikováno v:
Multimedia Tools and Applications. 82:18585-18597
Publikováno v:
Pattern Recognition Letters. 155:48-53
Publikováno v:
Circuits, Systems, and Signal Processing. 41:3011-3022
Publikováno v:
IET Image Processing, Vol 15, Iss 10, Pp 2240-2246 (2021)
Spectral clustering is one of the most widely used technologies for clustering tasks, which represents data as a weighted graph, and aims to find an appropriate way to cut the graph apart in order to categorize the raw data. The pivotal step of spect
Publikováno v:
Electronics; Volume 11; Issue 4; Pages: 572
Verification is one of the core steps in integrated circuits (ICs) manufacturing due to the multifarious defects and malicious hardware Trojans (HTs). In most cases, the effectiveness of the detection relies on the quality of the sample images of ICs