Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Zengju Fan"'
Publikováno v:
Microelectronic Engineering. 205:32-36
For ultraviolet nanoimprint lithography (UV-NIL), the resist volume shrinkage during curing not only influences the pattern fidelity but also induces defects in the demolding process due to strong adhesion. To address this issue, a novel nanoimprint
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::05bd58f945ea9e2f7632963b24b8e974
https://doi.org/10.1016/j.mee.2018.10.011
https://doi.org/10.1016/j.mee.2018.10.011
Autor:
Zhipeng Mei, Xingzhong Zhao, Weichuan Wang, Zengju Fan, Dazhi Sun, Xing Cheng, Yanqing Tian, Shanshan Wu, Hongting Fan
Publikováno v:
Sensors and Actuators B: Chemical. 271:104-109
Perovskite nanocrystals (PNCs) have emerged as advanced materials for various applications. Herein, we developed oxygen insensitive PNCs in polymer matrices and applied them as internal reference to achieve ratiometric sensing for oxygen. Significant
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f90cd26a90d12942b9fb15cffc5dbb01
https://doi.org/10.1016/j.snb.2018.05.074
https://doi.org/10.1016/j.snb.2018.05.074
Publikováno v:
RSC advances. 9(2)
A new type of biocompatible and photo-polymerizable hydrogel with oxygen sensors for microengineering was developed. Herein, a red emitter as an oxygen probe which was chemically immobilized in a poly(2-hydroxyethyl methacrylate)-co-polyacrylamide-ba
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::055c7c662a91683b2307f0e9707a03f0
https://pubmed.ncbi.nlm.nih.gov/35517627
https://pubmed.ncbi.nlm.nih.gov/35517627
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 35:011604
In ultraviolet (UV) nanoimprinting, polymerization of liquid monomers is generally accompanied by a decrease in the resist volume, which often causes problems such as residual stress, pattern distortion, and replication defects. Thus, it is highly de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::15c33cca93467cfd79541c64bb8c0815
https://doi.org/10.1116/1.4973301
https://doi.org/10.1116/1.4973301
Publikováno v:
Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Jan/Feb2017, Vol. 35 Issue 1, p1-6, 6p