Zobrazeno 1 - 7
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pro vyhledávání: '"Zeng, Kebo"'
Autor:
Chen, Yongliang, Zeng, Kebo, Xie, Zetao, Sha, Yixin, Chen, Zeling, Zhang, Xudong, Yang, Shu, Gong, Shimeng, Chen, Yiqin, Duan, Huigao, Zhang, Shuang, Yang, Yi
Electron-beam microscopy and spectroscopy featuring atomic-scale spatial resolution have become essential tools used daily in almost all branches of nanoscale science and technology. As a natural supercontinuum source of light, free electrons couple
Externí odkaz:
http://arxiv.org/abs/2410.16989
Autor:
Guan, Fuxin, Guo, Xiangdong, Zhang, Shu, Zeng, Kebo, Hu, Yue, Wu, Chenchen, Zhou, Shaobo, Xiang, Yuanjiang, Yang, Xiaoxia, Dai, Qing, Zhang, Shuang
Surface plasmon polaritons and phonon polaritons offer a means of surpassing the diffraction limit of conventional optics and facilitate efficient energy storage, local field enhancement, high sensitivities, benefitting from their subwavelength confi
Externí odkaz:
http://arxiv.org/abs/2308.14603
Autor:
Zeng, Kebo, Wu, Chenchen, Guo, Xiangdong, Guan, Fuxin, Duan, Yu, Zhang, Lauren L, Yang, Xiaoxia, Liu, Na, Dai, Qing, Zhang, Shuang
Detecting trace molecules remains a significant challenge. Surface-enhanced infrared absorption (SEIRA) based on plasmonic nanostructures, particularly graphene, has emerged as a promising approach to enhance sensing sensitivity. While graphene-based
Externí odkaz:
http://arxiv.org/abs/2307.09117
Autor:
Guan, Fuxin, Zeng, Kebo, Nie, Zhaoyu, Guo, Xiangdong, Ma, Shaojie, Dai, Qing, Pendry, John B., Zhang, Xiang, Zhang, Shuang
Superlenses made of plasmonic materials and metamaterials have been exploited to image features of sub-diffractional scale. However, their intrinsic losses impose a serious restriction on the imaging resolution, which is a long-standing problem that
Externí odkaz:
http://arxiv.org/abs/2303.16081
Akademický článek
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Autor:
Zeng, Kebo, Wu, Chenchen, Guo, Xiangdong, Guan, Fuxin, Duan, Yu, Zhang, Lauren L., Yang, Xiaoxia, Liu, Na, Dai, Qing, Zhang, Shuang
Publikováno v:
eLight; 1/5/2024, Vol. 4 Issue 1, p1-10, 10p
Autor:
Guan F; New Cornerstone Science Laboratory, Department of Physics, University of Hong Kong, Hong Kong, China., Guo X; New Cornerstone Science Laboratory, Department of Physics, University of Hong Kong, Hong Kong, China.; CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, China., Zeng K; New Cornerstone Science Laboratory, Department of Physics, University of Hong Kong, Hong Kong, China., Zhang S; CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, China., Nie Z; Department of Mechanical Engineering, University of California, Berkeley, CA 94720, USA., Ma S; New Cornerstone Science Laboratory, Department of Physics, University of Hong Kong, Hong Kong, China., Dai Q; CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, China., Pendry J; The Blackett Laboratory, Department of Physics, Imperial College London, SW7 2AZ London, UK., Zhang X; New Cornerstone Science Laboratory, Department of Physics, University of Hong Kong, Hong Kong, China.; Faculty of Science, University of Hong Kong, Hong Kong, China.; Faculty of Engineering, University of Hong Kong, Hong Kong, China., Zhang S; New Cornerstone Science Laboratory, Department of Physics, University of Hong Kong, Hong Kong, China.; Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong, China.
Publikováno v:
Science (New York, N.Y.) [Science] 2023 Aug 18; Vol. 381 (6659), pp. 766-771. Date of Electronic Publication: 2023 Aug 17.