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pro vyhledávání: '"Zeisler RL"'
Autor:
Marinenko RB; Surface and Microanalysis Science Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899, USA. ryna.marinenko@nist.gov, Turner S, Simons DS, Rabb SA, Zeisler RL, Yu LL, Newbury DE, Paul RL, Ritchie NW, Leigh SD, Winchester MR, Richter LJ, Meier DC, Scott KC, Klinedinst D, Small JA
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2010 Feb; Vol. 16 (1), pp. 1-12. Date of Electronic Publication: 2009 Dec 24.