Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Zegen Zhu"'
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 12, Pp 201-210 (2024)
In this work, for the first time, a machine learning behavioral modeling methodology based on gate recurrent unit (GRU) is developed and used to model and then analyze the kink effects (KEs) in the output reflection coefficient $(S_{22})$ and the sho
Externí odkaz:
https://doaj.org/article/c0ed1c01d72b468fb27c1aa3558028dc
Autor:
Zegen Zhu, Jialin Cai
Publikováno v:
2022 International Conference on Microwave and Millimeter Wave Technology (ICMMT).
Publikováno v:
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields. 35
Publikováno v:
2021 IEEE MTT-S International Wireless Symposium (IWS).
In this paper, a modified recurrent neural network (RNN) technique, long-short term memory (LSTM) algorithm based, small-signal behavioral modeling methodology for Gallium nitride (GaN) high electron mobility transistors (HEMTs) is presented. The ver