Development of crystal optics for X-ray multi-projection imaging for synchrotron and XFEL sources

Autor: Valerio Bellucci, Sarlota Birnsteinova, Tokushi Sato, Romain Letrun, Jayanath C. P. Koliyadu, Chan Kim, Gabriele Giovanetti, Carsten Deiter, Liubov Samoylova, Ilia Petrov, Luis Lopez Morillo, Rita Graceffa, Luigi Adriano, Helge Huelsen, Heiko Kollmann, Thu Nhi Tran Calliste, Dusan Korytar, Zdenko Zaprazny, Andrea Mazzolari, Marco Romagnoni, Eleni Myrto Asimakopoulou, Zisheng Yao, Yuhe Zhang, Jozef Ulicny, Alke Meents, Henry N. Chapman, Richard Bean, Adrian Mancuso, Pablo Villanueva-Perez, Patrik Vagovic

Publikováno v: Journal of Synchrotron Radiation, Vol 31, Iss 6, Pp 1534-1550 (2024)

X-ray multi-projection imaging (XMPI) is an emerging experimental technique for the acquisition of rotation-free, time-resolved, volumetric information on stochastic processes. The technique is developed for high-brilliance light-source facilities, a

Externí odkaz: https://doaj.org/article/5450c44c630e4f7f8fbd793be6aa3f6a

Compressive strain formation in surface-damaged crystals

Autor: Dušan Korytár, Enzo Rotunno, Zdenko Zaprazny, Claudio Ferrari, Sara Beretta

Publikováno v: J Appl Crystallogr
Journal of applied crystallography 53 (2020): 629–634. doi:10.1107/S1600576720003702
info:cnr-pdr/source/autori:Ferrari, Claudio; Beretta, Sara; Rotunno, Enzo; Korytar, Dusan; Zaprazny, Zdenko/titolo:Compressive strain formation in surface-damaged crystals/doi:10.1107%2FS1600576720003702/rivista:Journal of applied crystallography/anno:2020/pagina_da:629/pagina_a:634/intervallo_pagine:629–634/volume:53

The mechanism of formation of residual strain in crystals with a damaged surface has been studied by transmission electron microscopy in GaAs wafers ground with sandpaper. The samples showed a dislocation network located near the sample surface penet

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::814af5dd74ccb984d13d8817c72a8b6c
https://pubmed.ncbi.nlm.nih.gov/32684878