Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Zdeněk Kotásek"'
Autor:
Richard Růžička, Zdeněk Kotásek
Publikováno v:
IFAC Proceedings Volumes. 33:135-139
In the paper the survey of partial scan methodologies is presented. Existing approaches for selecting FFs for partial scan can be classified as testability analysis based, test generation based and structural analysis based. In the paper, the results
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11cbfe394e64a321af1184b124793be1
https://doi.org/10.1016/s1474-6670(17)35601-x
https://doi.org/10.1016/s1474-6670(17)35601-x
Publikováno v:
Electronic Notes in Theoretical Computer Science. 251:1-3
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3dee1ae719abc1de923468f539aab55d
https://doi.org/10.1016/j.entcs.2009.08.023
https://doi.org/10.1016/j.entcs.2009.08.023
This volume constitutes the thoroughly refereed post-conference proceedings of the 7th International Doctoral Workshop on Mathematical and Engineering Methods in Computer Science, MEMICS 2011, held in Lednice, Czech Republic, on October 14-16, 2011.
Publikováno v:
IFIP Advances in Information and Communication Technology ISBN: 9783642388521
IESS
IFIP Advances in Information and Communication Technology
4th International Embedded Systems Symposium (IESS)
4th International Embedded Systems Symposium (IESS), Jun 2013, Paderborn, Germany. pp.128-138, ⟨10.1007/978-3-642-38853-8_12⟩
IESS
IFIP Advances in Information and Communication Technology
4th International Embedded Systems Symposium (IESS)
4th International Embedded Systems Symposium (IESS), Jun 2013, Paderborn, Germany. pp.128-138, ⟨10.1007/978-3-642-38853-8_12⟩
Part 3: Verification; International audience; Nowadays highly competitive market of consumer electronics is very sensitive to the time it takes to introduce a new product. However, the ever-growing complexity of application specific instruction-set p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c42ca7e2ecfc8459f543011c39e39110
https://doi.org/10.1007/978-3-642-38853-8_12
https://doi.org/10.1007/978-3-642-38853-8_12
Publikováno v:
COMPUTING AND INFORMATICS; Vol 27, No 6 (2008): Computing and Informatics; 913–930
Benchmark circuits provide a basis for both research institutions and industry to measure their methods and products against. This paper focuses on utilization of recently published FITTest _BENCH06 benchmarks for measuring quality of our novel acade
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=issn13359150::9fdf6f6df709fcafc750c42daea63c26
http://www.cai.sk/ojs/index.php/cai/article/view/20
http://www.cai.sk/ojs/index.php/cai/article/view/20