Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Zaven M. Avetisyan"'
Autor:
V.Sh. Melikyan, Zaven M. Avetisyan, A.Kh. Mkhitaryan, Synopsys Armenia Cjsc, Artur A. Petrosyan, A.E. Mkrtchyan, Artak Hayrapetyan
Publikováno v:
Problems of advanced micro- and nanoelectronic systems development. :76-81
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6ab666250d624117ec152b83c440c31b
https://doi.org/10.31114/2078-7707-2018-4-76-81
https://doi.org/10.31114/2078-7707-2018-4-76-81
Autor:
V.Sh. Melikyan, Zaven M. Avetisyan, A.E. Mkrtchyan, Aristakes Hovsepyan, A.Kh. Mkhitaryan, Artur A. Petrosyan, Synopsys Armenia Cjsc, Artak Hayrapetyan
Publikováno v:
Problems of advanced micro- and nanoelectronic systems development. :63-68
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ef46bf685635a84afac15ed6f23bc5d
https://doi.org/10.31114/2078-7707-2018-1-63-68
https://doi.org/10.31114/2078-7707-2018-1-63-68
Autor:
Zaven M. Avetisyan
Publikováno v:
2019 IEEE 39th International Conference on Electronics and Nanotechnology (ELNANO).
Aging-aware standard cell libraries are characterized to estimate aging impact on digital integrated circuits (IC) and to measure parameters of digital IC after degradation. In existing libraries cells are characterized considering cell’s input sig
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8ae5b31ce489e65a50f4ea4d1b119771
https://doi.org/10.1109/elnano.2019.8783771
https://doi.org/10.1109/elnano.2019.8783771
Autor:
Armen A. Martirosyan, Vazgen Melikyan, Zaven M. Avetisyan, Manvel T. Grigoryan, Karen T. Khachikyan, Arman S. Petrosyan, Arman S. Trdatyan, Arthur S. Sahakyan
Publikováno v:
EWDTS
Transmitters' output signal correction is very important for high speed serial link standards such as Universal Serial Bus (USB), X Attachment Unit Interface (XAUI), Peripheral Component Interconnect (PCI), Double Data Rate (DDR) etc. Day by day inte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c67222b731bd65c05093f02b48728a7e
https://doi.org/10.1109/ewdts.2018.8524626
https://doi.org/10.1109/ewdts.2018.8524626
Autor:
Nune H. Beglaryan, Vardan P. Grigoryants, Zaven M. Avetisyan, Andranik K. Hayrapetyan, Simon H. Gharibyan, Artur Kh. Mkhitaryan, Vazgen Melikyan, Gegham A. Petrosyan
Publikováno v:
EWDTS
Low power, area efficient clocked comparator with high resolution was designed in SAED 32/28nm CMOS process for SAR ADC applications. The analog comparator is based on digital cells, hence doesn't have stability issues, mismatches induced by the diff
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::da421d9e0951d17682cdfee2ea3e0b86
https://doi.org/10.1109/ewdts.2018.8524737
https://doi.org/10.1109/ewdts.2018.8524737
Autor:
Shavarsh V. Melikyan, Zaven M. Avetisyan, Artur A. Petrosyan, Andranik K. Hayrapetyan, Artur Kh. Mkhitaryan, Vazgen Melikyan
Publikováno v:
2018 IEEE 38th International Conference on Electronics and Nanotechnology (ELNANO).
This paper proposes a method of voltage overshoot correction during the load switching-off in the integrated circuits (ICs) where the negative feedback voltage regulators are used. Method uses fictive dynamic load to compensate the fast switching-off
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8da7447002bd74ca493807020fea0cb1
https://doi.org/10.1109/elnano.2018.8477569
https://doi.org/10.1109/elnano.2018.8477569