XPS profiling study of Al2O3 passivation layers for high efficiency n-PERT and PERC solar cells

Autor: Béchu, Solène, Loubat, Anais, Bouttemy, Muriel, Marot, Yves, Blévin, Thomas, Langlois, Jonathan, Zauner, Andy, Frégnaux, Mathieu, Aureau, Damien, Vigneron, Jackie, Uhlig, Peter, Pouliquen, Sylvain, Etcheberry, Arnaud

Publikováno v: 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC), Jun 2018, Waikoloa Village, France. pp.3069-3072, ⟨10.1109/PVSC.2018.8547412⟩

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::88c17e40c70fffe4ebde06cf0d845b7c
https://hal.science/hal-02393374

MOCVD PBZR x ti 1−x o 3 thin films on platinized silicon wafers and srtio 3 crystals.

Autor: Moret, Mona P., Devillers, Marijn A.C., Zauner, Andy R.A., Aret, Edwin, Hageman, Paul R., Larsen, Poul K.

Publikováno v: Integrated Ferroelectrics; Jan2001, Vol. 36 Issue 1-4, p265-274, 10p