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of 2
pro vyhledávání: '"Zarka Zarkov"'
Autor:
Brenda Ross, Peng Zhang, Simon G. Kaplan, Zarka Zarkov, Bridgette M. Budhlall, John H. Burnett, Xiaoping Gao, Gene Everad Parris
Publikováno v:
Optical Microlithography XVIII.
For the next-generation immersion lithography technology, there is a growing interest in the immersion fluids having a refractive index larger than 1.5 and low absorbance at 193nm wavelength. In this paper, we report our effort in identifying new imm
Autor:
Todd Davis, Danielle M. King, Manuel Jaramillo, Zarka Zarkov, Ted A. Paxton, Peng Zhang, Thomas John Markley, David Witko
Publikováno v:
Advances in Resist Technology and Processing XX.
Surfactant-formulated developers were utilized to enhance the CD performance for 365nm (I-line), 248nm (DUV) and 193nm resist processing. From one generation to the next, the resist surface becomes more and more hydrophobic, creating the need for enh