Zobrazeno 1 - 10
of 59
pro vyhledávání: '"Zameshin, A."'
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, B May 2023 538:47-57
Autor:
Zameshin, Andrey A., Yakshin, Andrey E., Sturm, Jacobus M., Boas, Cristiane Stilhano Vilas, Bijkerk, Fred
Low Energy Ion Scattering (LEIS) was employed to study the surface composition of thin films of Ru on B, C and B4C films at different stages of growth. Effects of surface segregation of C were observed. Previously unknown matrix effects were observed
Externí odkaz:
http://arxiv.org/abs/1809.01918
Autor:
Phadke, Parikshit, Zameshin, Andrey A., Sturm, Jacobus M., van de Kruijs, Robbert W.E., Bijkerk, Fred
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, B 1 June 2022 520:29-39
Publikováno v:
In Thin Solid Films 30 April 2021 724
Publikováno v:
AIP Advances, Vol 10, Iss 4, Pp 045305-045305-8 (2020)
X-ray W/B multilayer mirrors with a period of 2.5 nm were deposited by dc magnetron sputtering and studied in comparison with W/Si multilayer systems of the same period. Transmission electron microscopy, grazing incidence X-Ray reflectivity, and x-ra
Externí odkaz:
https://doaj.org/article/130623fdc8c448b48ca6ec4de081e1c2
Autor:
Parikshit Phadke, Andrey A. Zameshin, Jacobus M. Sturm, Robbert W.E. van de Kruijs, Fred Bijkerk
Publikováno v:
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 520, 29-39. Elsevier
Semi-empirical formulae like the Yamamura model provide a quick reference of sputter yields for applications such as sputter depth profiling and secondary ion mass spectrometry. Fit parameters in such models are prone to errors which can propagate in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::62a137e6ff9161f94d083bcfafff344f
http://www.scopus.com/inward/record.url?scp=85128149340&partnerID=8YFLogxK
http://www.scopus.com/inward/record.url?scp=85128149340&partnerID=8YFLogxK
Publikováno v:
Physics@Veldhoven 2022
Low Energy Ion Scattering (LEIS) is a valuable tool for the characterization of thin film structures because it provides a unique way to measure both the elemental composition of the outer atomic layer and the subsurface elemental distribution (0-10n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=narcis______::02dfb842e31f3aab4cdc5b0f56614b8d
https://research.utwente.nl/en/publications/21c9545a-3aa7-425a-a3dd-ed3099e5af70
https://research.utwente.nl/en/publications/21c9545a-3aa7-425a-a3dd-ed3099e5af70
Publikováno v:
Journal of Applied Physics; 10/7/2019, Vol. 126 Issue 13, pN.PAG-N.PAG, 7p, 1 Chart, 4 Graphs
Autor:
Medvedev, R. V., Nikolaev, K. V., Zameshin, A. A., IJpes, D., Makhotkin, I. A., Yakunin, S. N., Yakshin, A. E., Bijkerk, F.
Publikováno v:
Journal of Applied Physics; 7/28/2019, Vol. 126 Issue 4, pN.PAG-N.PAG, 10p, 1 Diagram, 1 Chart, 9 Graphs
Autor:
Anirudhan Chandrasekaran, Jacobus Marinus Sturm, Andrey Zameshin, Fred Bijkerk, Robbert Wilhelmus Elisabeth van de Kruijs
Publikováno v:
ACS Applied Materials & Interfaces
ACS applied materials & interfaces, 11(49). American Chemical Society
ACS applied materials & interfaces, 11(49). American Chemical Society
A comprehensive study on the growth of nanoscale transition metal-on-transition metal (TM-on-TM) systems is presented. The near room-temperature intermixing and segregation phenomena during growth are studied in vacuo using high-sensitivity low-energ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::784ce0a1ee873e4225478a747bc95617
http://europepmc.org/articles/PMC6909253
http://europepmc.org/articles/PMC6909253