Zobrazeno 1 - 10
of 55
pro vyhledávání: '"Zakharenko, M.I."'
Autor:
Polishchuk, D.M., Pod'yalovskii, D.I., Matviyenko, A.I., Tovstolytkin, A.I., Zakharenko, M.I., Semen'ko, M.P.
Publikováno v:
In Journal of Magnetism and Magnetic Materials August 2013 340:109-112
Publikováno v:
In Journal of Non-Crystalline Solids 15 January 2012 358(2):137-144
Publikováno v:
In Journal of Alloys and Compounds 24 March 2004 367(1-2):41-46
Publikováno v:
In Journal of Alloys and Compounds 2003 348(1):138-145
Publikováno v:
In Journal of Alloys and Compounds 2003 353(1):17-22
The influence of structural relaxation on the electric resistivity p and structure parameters of low-alloyed Co—Cr—Si—B amorphous metallic alloys has been studied. These materials show a minimum in p(T) dependences. It has been shown that the s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::c8131c64863f10b6bb2a47f99335d590
http://dspace.nbuv.gov.ua/handle/123456789/136466
http://dspace.nbuv.gov.ua/handle/123456789/136466
Temperature dependences of electric resistivity have been investigated in 300-950 К temperature range for Со₆₅.₅Ме₆.₅(Si,B)₂₈ metallic glasses (Ме = Fе, Сr). Several characteristic temperature intervals have been distinguished
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::eeae10f475b5e75035196b7da6425ad5
http://dspace.nbuv.gov.ua/handle/123456789/137708
http://dspace.nbuv.gov.ua/handle/123456789/137708
The crystallization kinetics of the amorphous alloys on the base of Fe₈₂Si₂В₁₆ has been studied under isothermal annealing using magnetometric method. The apparent crystallization activation energy of Еₐ and Avrami exponent n have been
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::0c56756b6f46b04c36557f4f4208297b
http://dspace.nbuv.gov.ua/handle/123456789/137253
http://dspace.nbuv.gov.ua/handle/123456789/137253
Autor:
Nakonechna, O.I., Zakharenko, M.I.
Structural and mechanical properties of nanocomposite TiAI(Si)N thin films prepared using arc-plasma PVD deposition technique on WC-Co substrates have been characterized by X-ray diffraction and nanoindentation. TEM have been used to study the micros
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::dcd5dfe9ad97c680f9261fbdcf110c60
http://dspace.nbuv.gov.ua/handle/123456789/139468
http://dspace.nbuv.gov.ua/handle/123456789/139468
Autor:
Shpilevsky, E.M., Shpilevsky, M.E., Prylutskyy, Y.I., Matzuy, L.Y., Zakharenko, M.I., Le Normand, F.
Publikováno v:
Materialwissenschaft und Werkstoffechnik; Jan2011, Vol. 42 Issue 1, p59-63, 5p