Zobrazeno 1 - 10
of 163
pro vyhledávání: '"ZHAO Shiteng"'
Publikováno v:
Journal of Aeronautical Materials, Vol 44, Iss 5, Pp 154-173 (2024)
High-entropy alloys（HEAs）have attracted considerable attention from the research community as a pioneering alloy design paradigm over the past two decades. They have fundamentally challenged traditional design paradigms and exhibited exceptional
Externí odkaz:
https://doaj.org/article/2cfcd863e3c746e1913afa432a61eedc
Autor:
Zhao Shiteng, Kad Bimal, Hahn Eric, Chen Laura, Opachi Yekaterina,, More Karren, Remington Bruce, Wehrenberg Christopher, LaSalvia Jerry, Yang Wen, Quan Haocheng, Meyers Marc
Publikováno v:
EPJ Web of Conferences, Vol 183, p 03027 (2018)
Deposition of powerful pulsed laser energy onto a material, ablates its surface and drives a compressive shock wave propagating through it. Using this technique, unprecedented states of matter with extremely high pressures, temperatures, and strain r
Externí odkaz:
https://doaj.org/article/eefafc7881ee40acbc079a8024397387
Publikováno v:
EPJ Web of Conferences, Vol 183, p 03028 (2018)
Dynamic behavior of the single phase (fcc) Al0.3CoCrFeNi and CoCrFeMnNi high-entropy alloys (HEAs) was examined. The combination of multiple strengthening mechanisms such as solid solution hardening, cutting forest dislocation, as well as mechanical
Externí odkaz:
https://doaj.org/article/7f041d7abfc54a80a6a040a3a7cfb58a
Autor:
Pandolfi, Silvia, Zhao, Shiteng, Turner, John, Ercius, Peter, Song, Chengyu, Dhall, Rohan, Menguy, Nicolas, Godec, Yann Le, Courac, Alexandre, Minor, Andrew M., Eggert, Jon, Dresselhaus-Marais, Leora E.
In this work we present a detailed structural characterization of Si-4H, a newly discovered bulk form of hexagonal silicon (Si) with potential optoelectronic applications. Using multi-scale imaging, we reveal a hierarchical structure in the morpholog
Externí odkaz:
http://arxiv.org/abs/2110.02943
Autor:
Chen, Xiaofeng, Zheng, Lijing, Zhu, Qianyong, Zhao, Shiteng, Yu, Feng, Liu, Minghui, Liu, Huihe, Zhang, Hu, Xu, Huibin
Publikováno v:
In Acta Materialia 1 June 2024 271
Publikováno v:
In Journal of Materials Research and Technology March-April 2024 29:3842-3848
Autor:
Zhang, Xiuzhen, Yang, Chao, Meng, Lei, Chen, Zhenghao, Gong, Wu, Sun, Binhan, Zhao, Shiteng, Zhang, Deliang, Li, Yue, Zhou, Dengshan
Publikováno v:
In International Journal of Plasticity February 2024 173
Autor:
Yan, Keyu, Xu, Yichen, Niu, Jiejue, Wu, Yuye, Li, Yue, Gault, Baptiste, Zhao, Shiteng, Wang, Xiaoxiao, Li, Yunquan, Wang, Jingmin, Skokov, Konstantin P., Gutfleisch, Oliver, Wu, Haichen, Jiang, Daqiang, He, Yangkun, Jiang, Chengbao
Publikováno v:
In Acta Materialia 1 January 2024 264
Autor:
Zhou, Xichen, Zhu, Qianyong, Liang, Xiao, Jia, Qihan, Zhang, Cheng, Zhao, Shiteng, Guo, Hongbo
Publikováno v:
In Scripta Materialia 1 March 2025 257
Autor:
Savitzky, Benjamin H, Hughes, Lauren A, Zeltmann, Steven E, Brown, Hamish G, Zhao, Shiteng, Pelz, Philipp M, Barnard, Edward S, Donohue, Jennifer, DaCosta, Luis Rangel, Pekin, Thomas C., Kennedy, Ellis, Janish, Matthew T, Schneider, Matthew M, Herring, Patrick, Gopal, Chirranjeevi, Anapolsky, Abraham, Ercius, Peter, Scott, Mary, Ciston, Jim, Minor, Andrew M, Ophus, Colin
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D im
Externí odkaz:
http://arxiv.org/abs/2003.09523