Zobrazeno 1 - 10
of 35
pro vyhledávání: '"Z. Zh, Zhanabaev"'
Autor:
Z. Zh. Zhanabaev
Publikováno v:
Physical Sciences and Technology, Vol 7, Iss 3-4, Pp 37-43 (2020)
At present, the study of complex electro-physical characteristics of semiconductor nanofilaments and nanofilms is of interest: the presence of non-monotonic oscillating characteristics with memory, areas of negative differential resistance. The aim o
Externí odkaz:
https://doaj.org/article/dc10cae4c3d947279d7b449afcb08071
Publikováno v:
Eurasian Physical Technical Journal; 2023, Vol. 20 Issue 4, p111-115, 5p
Publikováno v:
Physical Sciences and Technology, Vol 4, Iss 2 (2018)
In the present work we have proved theoretically and experimentally that porous silicon layers with optimal thickness can be effectively used as anti-reflection coatings in solar cells and panels. In our work we have taken into account joint mechanis
Externí odkaz:
https://doaj.org/article/9b89c428b2eb449188e5c5254593718f
Autor:
Z. Zh., Zhanabaev, N. M., Ussipov
Publikováno v:
Eurasian Physical Technical Journal; 2023, Vol. 20 Issue 2, p79-86, 8p
Autor:
A. O. Tileu, Z. Zh. Zhanabaev, D. A. Turlykozhayeva, A. K. Khaniyeva, S. B. Ikramova, A. A. Maksutova, B. A. Khaniyev
Publikováno v:
Physical Sciences and Technology, Vol 7, Iss 3-4, Pp 37-43 (2020)
At present, the study of complex electro-physical characteristics of semiconductor nanofilaments and nanofilms is of interest: the presence of non-monotonic oscillating characteristics with memory, areas of negative differential resistance. The aim o
Publikováno v:
Eurasian Physical Technical Journal; 2022, Vol. 19 Issue 3, p84-90, 7p
Publikováno v:
International Journal of Mathematics and Physics. 9:90-96
Information entropy and fractal dimension of a set of physical values are usually used us quantitative characteristic of chaos. Normalization of entropy is a well-known problem. This work is devoted to develop a method to do this. In the work propose
Publikováno v:
Physical Sciences and Technology. 4:74-79
Autor:
Dana Yermukhamed, Victor Yu. Timoshenko, Almas Serikbayev, K. A. Gonchar, Akylbek Turmukhambetov, Rakhila Assilbayeva, Tatyana Grevtseva, Z. Zh. Zhanabaev, Kazakhstan Aktau, G.K. Mussabek
Publikováno v:
Proceedings of the V International conference Information Technology and Nanotechnology 2019.
This work has been done to identify quantitative criteria the degree of order and chaos morphology of porous layers consisting of silicon nanowire arrays. In order to fulfill the work, a method of using metal-assisted chemical etching has been utiliz
Publikováno v:
Sensor Letters. 14:588-591