Zobrazeno 1 - 10
of 39
pro vyhledávání: '"Z. Zawislak"'
Publikováno v:
Microelectronics Reliability. 48:881-885
Low-frequency noise spectroscopy is used to examine the interactions between resistive and conductive films that take place during thick-film resistor (TFR) fabrication. Two noise parameters are introduced to quantitatively describe the strength of t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::771642861ab0c11bde7d0d5f4039e7b6
https://doi.org/10.1016/j.microrel.2008.03.012
https://doi.org/10.1016/j.microrel.2008.03.012
Publikováno v:
Sensors and Actuators A: Physical. 137:51-56
1/ f noise was measured for LakeShore RX-202A resistance temperature sensor. Its intensity increases significantly when the temperature is lowered below a few kelvin. It is shown that this rise in the noise intensity leads to the decrease in the temp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::778589d33c926a53323753c306f16a9f
https://doi.org/10.1016/j.sna.2007.02.034
https://doi.org/10.1016/j.sna.2007.02.034
Autor:
Andrzej Kolek, Olga Markowska, Antoni Rogalski, Andrzej Kowalewski, P. Pta, L. Ciura, Z. Zawislak, Jarosław Wróbel
Publikováno v:
2015 International Conference on Noise and Fluctuations (ICNF).
The paper concerns the correlations between low-frequency noise and dark currents in the p-i-n diode made of type-II InAs/GaSb superlattice material designed for mid-wavelength infrared. It is shown that diffusion and generation-recombination current
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b629af6e415968fea30bf97414d0fab5
https://doi.org/10.1109/icnf.2015.7288596
https://doi.org/10.1109/icnf.2015.7288596
Autor:
A. W. Stadler, Elena Plis, L. Ciura, Piotr Martyniuk, Antoni Rogalski, Andrzej Kolek, Andrzej Kowalewski, Nutan Gautam, Jarosław Wróbel, Z. Zawislak, Sanjay Krishna
Publikováno v:
2013 22nd International Conference on Noise and Fluctuations (ICNF).
The paper concerns low-frequency properties of mid-wavelength infrared type-II InAs/GaSb superlattice nBn detector. The current noise was directly measured in the range of 1-104 Hz at 77 K and detectivity was determined in this frequency range and te
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7a6dcfc7c2f965e4cb27371bb412bcf7
https://doi.org/10.1109/icnf.2013.6579013
https://doi.org/10.1109/icnf.2013.6579013
Publikováno v:
28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005..
A study on low-frequency noise sources in thick film resistors made of resistive pastes based on ruthenium dioxide and glass has been presented. The paper focuses on the excess noise spectrum dependence on temperature in the range 77 K < T < 300 K. A
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4946cda821b8b7ec027f0b52690f9273
https://doi.org/10.1109/isse.2005.1491057
https://doi.org/10.1109/isse.2005.1491057
Publikováno v:
28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005..
The paper concerns low-frequency noise of RuO2+glass thick film resistors. Recent experiments performed in liquid helium temperatures indicate that at large bias the noise become nonlinear, that is its power spectral density SVex does not scale with
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::af920280e1d6a3d1844ddba2c0b06ef8
https://doi.org/10.1109/isse.2005.1491058
https://doi.org/10.1109/isse.2005.1491058
Publikováno v:
ResearcherID
It is shown that increase of low‐frequency noise observed for Ru‐based thick film devices in temperatures below few Kelvins results in poorer resolution of temperature measurements when these devices serve as temperature sensors.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1638fac32ab7e2936d948f1e3cb23c28
https://doi.org/10.1063/1.2036723
https://doi.org/10.1063/1.2036723
Publikováno v:
26th International Spring Seminar on Electronics Technology: Integrated Management of Electronic Materials Production, 2003..
Low frequency noise has been measured in RuO/sub 2/+ glass thick film resistors in subkelvin temperatures and in magnetic fields. Samples were fabricated from laboratory-made pastes, which did not contain any modifiers (only RuO/sub 2/ and glass of k
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1bc3761b147c074507f75228812a8ba7
https://doi.org/10.1109/isse.2003.1260515
https://doi.org/10.1109/isse.2003.1260515
Autor:
Piotr Szałański, A. W. Stadler, Z. Zawislak, Andrzej Dziedzic, Andrzej Kolek, K. Mleczko, D. Zak
Publikováno v:
26th International Spring Seminar on Electronics Technology: Integrated Management of Electronic Materials Production, 2003..
The resistors, made of inks with the high content of conductive oxide in a standard "on-alumina" process are subjected to easy rubbing off. The use of LTCC technology enables embedding the samples inside a ceramic substrate which make them insensitiv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4320084f13e73ed1b08738a125ddcb01
https://doi.org/10.1109/isse.2003.1260517
https://doi.org/10.1109/isse.2003.1260517
Publikováno v:
26th International Spring Seminar on Electronics Technology: Integrated Management of Electronic Materials Production, 2003..
RuO/sub 2/-glass based materials gain the application in construction of modern temperature sensors in cryogenics. This is due to their high temperature sensitivity, remaining virtually insensitive to magnetic field. The paper addresses the question
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::58661d9dbbadb0bb3001f6c00afc03bb
https://doi.org/10.1109/isse.2003.1260530
https://doi.org/10.1109/isse.2003.1260530