Zobrazeno 1 - 10
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pro vyhledávání: '"Z. Shiolashvili"'
Akademický článek
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Autor:
D. Jishiashvili, X. Devaux, V. Gobronidze, Nino Makhatadze, Vassilios Kapaklis, C. Politis, Z. Shiolashvili, E. R. Kutelia
Publikováno v:
Advanced Science Letters. 2:40-44
A simple pyrolytic: technology was developed in this paper for producing Germanium nitride nanowires. Hydrazine was used as the nitriding agent, while the 3 mol.% of water diluted in it served for ...
Autor:
Jishiashvili, D., Shiolashvili, Z. Shiolashvili, Makhatadze, N., Jishiashvili, A., Gobronidze, V., Sukhanov, D.
InP/Ga2O3 core-shell nanowires were grown on Si substrate at 400 ºC in the hydrazine (N2H4) vapor diluted with 3 mol. % H2O. The crystalline InP and solid Ga served as source materials for the growth of nanowires. According to TEM and EDX data the n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0460a6448d6d32ec0208be9c2d59ca49
Publikováno v:
physica status solidi (a). 202:1778-1785
The effective surface passivation is a key to achieve useful metal–insulator–semiconductor devices on GaAs. In this work, the composition and structure of the pyrolytic GeOxNy film deposited on GaAs in the hydrazine vapour has been studied by Aug
Publikováno v:
2009 International Semiconductor Conference.
The two types of single-crystalline α-Ge 3 N 4 nanowires (NWs) were synthesized at 550°C by annealing the crystalline Ge sample in the hydrazine vapor containing 3 mol.% of water. The mass transfer was accomplished by volatile GeO molecules. The ta
Autor:
R. Janelidze, D. Jishiashvili, Z. Shiolashvili, I. Nakhutsrishvili, E. Kutelia, V. Gobronidze, L. Mosidze, M. Katsiashvili
Publikováno v:
1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings.
Application of amorphous, high resistivity O- and N-doped Ge films is proposed to solve some radiation hardness problems. The new type of insulating a-Ge:(O,N) films makes it possible to increase the radiation hardness of metal-insulator-semiconducto
Publikováno v:
2001 International Semiconductor Conference. CAS 2001 Proceedings (Cat. No.01TH8547).
Auger electron spectroscopy (AES) was used to study the solid phase surface reactions and Ge diffusion process during the thermal treatment (500-750/spl deg/C) of GeO/sub 2//(111)GaAs structures. Different results were obtained for the A and B surfac
Publikováno v:
2002 Proceedings. 8th International Advanced Packaging Materials Symposium (Cat. No.02TH8617).
The sublimation of GeO molecules formed by the solid phase reaction between a-Ge and a-GeO/sub 2/ films (Ge+GeO/sub 2/=2GeO?) was studied using vacuum microbalance. The c-Si/Ge/GeO/sub 2/, c-Si/GeO/sub 2/ /Ge, c-Ge/GeO/sub 2/ and c-Si/GeO/GeO/sub 2/
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Akademický článek
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