Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Z. J. Delalic"'
Autor:
Shahriar Jahanian, Z. J. Delalic
Publikováno v:
Reliability, Stress Analysis, and Failure Prevention Issues in Adhesive and Bolted Connections.
High speed computation is driving VLSI custom chips into smaller micron sizes and scale down power supplies. To accomplish very high speed, industry is developing shut down methods and short channel devices. Going below 0.5 micron technology speed is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e66561eda3536d1f20b78fd5ad07bf59
https://doi.org/10.1115/imece1999-1183
https://doi.org/10.1115/imece1999-1183
Publikováno v:
Volume 5: 13th Biennial Conference on Reliability, Stress Analysis, and Failure Prevention.
CMOS technology in the past twenty years has followed the path of device scaling for achieving density, speed, and power improvements. The advancement of lithographic techniques propelled the scaling also of the fine lines to 1 urn width and below. S
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::214af1d110bcc4569f8d32249669e6ed
https://doi.org/10.1115/detc99/rsafp-8847
https://doi.org/10.1115/detc99/rsafp-8847
Publikováno v:
IEEE transactions on medical imaging. 8(4)
This study introduces a method for automated analysis of the standard solid-meal gastric emptying test. The purpose was to develop a diagnostic tool to characterize more reproducibly abnormalities of solid-phase gastric emptying. The processing of ga
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::63821c79f8952bee51c06ce9f43bd0bd
https://pubmed.ncbi.nlm.nih.gov/18230536
https://pubmed.ncbi.nlm.nih.gov/18230536