Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Z R Zytkiewicz"'
Publikováno v:
Nanotechnology. 30(15)
A comprehensive description of the self-assembled formation of GaN nanowires (NWs) by plasma-assisted molecular beam epitaxy (PAMBE) on amorphous-Al
Autor:
Patrick J. McNally, M. Karilahti, Fredrik Olsson, T. Tuomi, Z. R. Zytkiewicz, Aapo Lankinen, Sebastian Lourdudoss, J. Z. Domagala, Yan-Ting Sun
Publikováno v:
Crystal Growth & Design. 6:1096-1100
Defects in epitaxial laterally overgrown (ELO) InP layers are examined by high-resolution X-ray diffraction and synchrotron X-ray back-reflection and transmission topography. X-ray diffraction maps produce information about the overall crystal qualit
Publikováno v:
Semiconductor Science and Technology. 14:465-469
Results of epitaxial lateral overgrowth (ELO) of GaAs on (001) GaAs substrates by liquid phase epitaxy are reported. We show that by introducing Si, Sn or Te impurities to the Ga-As solution the vertical growth rate is reduced while the lateral growt
Publikováno v:
Materials Science and Technology. 12:193-196
Results obtained for the first time using Ga2S3 and Ga2Se3 compounds as sources of donor elements for the molecular beam epitaxy of AlxGa1−xSb (0≤x≤1) and AlxGa1−x As (0≤x≤0·4) are reported. In GaAs, free electron concentrations obtained
Publikováno v:
Semiconductor Science and Technology. 10:509-514
The first results obtained with a use of Ga2S3 and Ga2Se3 compounds as sources of donor elements for the molecular beam epitaxy of AI,Ga1-xSb (0
Publikováno v:
Semiconductor Science and Technology. 8:1973-1976
Detailed studies of the absorption kinetics of the DX centre are presented. These studies were performed on unique thick AlGaAs:Te layers and clearly demonstrated the participation of the neutral charge state of DX as an intermediate state in the pho
Publikováno v:
Physical Review Letters. 68:2508-2511
A high-resolution Laplace-transform deep-level-transient spectroscopy has been used to study electon emission from the DX centers related to group-IV (silicon) and group-VI (tellurium) donor elements in ${\mathrm{Al}}_{\mathit{x}}$${\mathrm{Ga}}_{1\m
Autor:
Z. R. Zytkiewicz, J. Domagala
Publikováno v:
Applied Physics Letters. 75:2749-2751
X-ray diffraction was used to study deformation of GaAs layers grown on Si substrates by liquid phase epitaxial lateral overgrowth (ELO). We show that, in the direction perpendicular to seeding lines, the GaAs ELO stripes bend outwards from the mask
Autor:
D. Dobosz, Z. R. Zytkiewicz
Publikováno v:
Heterostructure Epitaxy and Devices — HEAD’97 ISBN: 9780792350132
Heterostructure Epitaxy and Devices — HEAD’97
Heterostructure Epitaxy and Devices — HEAD’97
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a1f93b47bbe6d56d2103b42dd2038b2
https://doi.org/10.1007/978-94-011-5012-5_9
https://doi.org/10.1007/978-94-011-5012-5_9
Publikováno v:
Crystal Research & Technology; Oct2009, Vol. 44 Issue 10, p1089-1094, 6p