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pro vyhledávání: '"Yvonne Yeo Chii"'
Publikováno v:
2016 IEEE Region 10 Conference (TENCON).
As memory technology scaling continues to advance to sub 20nm technology and memory capacity becomes higher, memory quality management becomes more challenging to achieve client's quality expectations especially in this new era of computing. Transfor
Publikováno v:
2007 5th Student Conference on Research and Development.
In wafer foundry it is important to make use of reliability monitoring strategy as part of process monitoring. A fast reliability monitoring strategy has been developed, which enables a fast feedback to the production line. The three main critical re