Zobrazeno 1 - 2
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pro vyhledávání: '"Yves Kessener"'
Autor:
Yves Kessener, Ruud Vullers, Olivier Tousignant, James J. Miller, Willem H. Maes, Inge M. Peters
Publikováno v:
Medical Imaging 2020: Physics of Medical Imaging.
X-ray detectors increasingly utilize active pixel CMOS instead of amorphous silicon technology because of its superior noise, pixel lag, readout speed and offset stability. We already demonstrated [1] that adding an a additional pixel capacitance to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f6d2525d4e0f0058a470f42bd76abab9
https://doi.org/10.1117/12.2549236
https://doi.org/10.1117/12.2549236
Publikováno v:
SPIE Proceedings.
Compared to published amorphous-silicon (TFT) based X-ray detectors, crystalline silicon CMOS-based active-pixel detectors exploit the benefits of low noise, high speed, on-chip integration and featuring offered by CMOS technology. This presentation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::20cf288e3bd55dbdf0e9f1b00d96d2ad
https://doi.org/10.1117/12.2081996
https://doi.org/10.1117/12.2081996