Zobrazeno 1 - 10
of 115
pro vyhledávání: '"Yves Danto"'
Publikováno v:
Advances in Technology Innovation, Vol 3, Iss 3, Pp 126-132 (2018)
This paper reports an innovative pedagogic experience performed at South-East University (SEU) with electrical engineering Bachelor honors students (computer science, mechanics, and electronics). The purpose was to develop their motivation and to mak
Externí odkaz:
https://doaj.org/article/8fe33a4b69f44f9e80a6853876738f8d
Autor:
Laurent Béchou, Daniel T. Cassidy, Yves Danto, Yannick Deshayes, Mitsuo Fukuda, Samuel K.K. Lam, Giulia Marcello, Laurent Mendizabal, Giovanna Mura, Yves Ousten, Valerio Sanna Valle, Massimo Vanzi, Frédéric Verdier
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ac20bdaac777bf9e7978008e289f0968
https://doi.org/10.1016/b978-1-78548-154-3.50011-2
https://doi.org/10.1016/b978-1-78548-154-3.50011-2
Autor:
Yves Ousten, Yves Danto, Yannick Deshayes, Laurent Bechou, Frédéric Verdier, Laurent Mendizabal
High performances and high reliability are two of the most important goals driving the penetration of optical transmission into telecommunication systems ranging from 880 to 1550 nm. However, performance of high-rate optical communications systems is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff9bca118ea49121fe61adf154129127
https://doi.org/10.1016/b978-1-78548-154-3.50003-3
https://doi.org/10.1016/b978-1-78548-154-3.50003-3
Publikováno v:
2017 27th EAEEIE Annual Conference (EAEEIE).
The Higher education pedagogy is the object of a strong evolution mainly due to the coming of digital society. This evolution supposes the capability to the future graduate students to apply microelectronics knowledge and know-how to the future conne
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 6:228-234
This paper presents an original method of analog circuits aging simulation. This method is based on a behavioral modelling of circuits that includes the effects of degradations on circuit parameters, on the basis of transistors aging. The efficiency
Autor:
Jean-Luc Goudard, Yves Danto, A. Denolle, Laurent Bechou, Yannick Deshayes, Nicolas Zerounian, Frédéric Aniel, D. Laffitte, S. Huyghe
Publikováno v:
Microelectronics Reliability. 45:1593-1599
This paper demonstrates the complementary relation between functional parameters and electroluminescence spectroscopy for reliability investigations of 1550 nm Semiconductor Optical Amplifiers of 700 μm length active region. Ageing tests have been s
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 5:564-571
Scanning experiments on a very large scale integrated (VLSI) circuit are presented using the picosecond ultrasonics technique. This optical nondestructive technique is based on ultrasound generation and detection by ultrashort laser pulses. The exper
Publikováno v:
Microelectronics Reliability. 45:1658-1661
Automotive requirements are nowadays not only limited to high temperatures but more and more demands are driven towards vibration and higher acceleration values due to the direct mounting of the Electronic Control Units on the Engine. Temperature cyc
Publikováno v:
Quality and Reliability Engineering International. 21:571-594
Numerous papers have already reported various results on electrical and optical performances of GaAs-based materials for optoelectronic applications. Other papers have proposed some methodologies for a classical estimation of reliability of GaAs comp
Publikováno v:
Microelectronics Reliability. 43:1513-1518