Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Yuzo Takita"'
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 3:1554-1563
The concept of target impedance can be significantly improved, based on the rigorous closed-form expressions for transient supply voltage ripple excited by an integrated circuit (IC) switching current, for the power distribution network (PDN) with po
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c05b5d50c22eb54034570e3a6a963007
https://doi.org/10.1109/tcpmt.2012.2232353
https://doi.org/10.1109/tcpmt.2012.2232353
Autor:
Junji Maeshima, Taketoshi Sekine, Hideki Shumiya, Benjamin Orr, Kenji Araki, Suyu Yang, Yuzo Takita, David Pommerenke
Publikováno v:
2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
In this paper a method for separating local soft-failures from distant errors related to noise on the power distribution network (PDN) is demonstrated. Two approaches are used which duplicate the noise on a PDN caused by some intentional injection on
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::35815f66f94a3be9f53f08d88f2610c9
https://doi.org/10.1109/eosesd.2016.7592564
https://doi.org/10.1109/eosesd.2016.7592564
Autor:
Yilong Zhang, Kenji Araki, Junji Maeshima, David Pommerenke, Benjamin Orr, Hideki Shumiya, Taketoshi Sekine, Yuzo Takita, Suyu Yang, Yuangdong Guo
Publikováno v:
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC).
In this paper, several methods are outlined for detecting functional changes in an IC due to external interference such as ESD or EMI. The goal is to provide diagnostic tools for detection of potential soft failure susceptibilities of complex systems
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d100ed159986f1015a2e40adaf91d620
https://doi.org/10.1109/isemc.2016.7571597
https://doi.org/10.1109/isemc.2016.7571597
Autor:
James L. Drewniak, Yuzo Takita, Jingook Kim, Hayato Takeuchi, Kenji Araki, Songping Wu, Liang Li, Jun Fan, Hanfeng Wang
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility. 54:1112-1124
Closed-form expressions for transient power distribution network (PDN) noise caused by an IC switching current are derived for a PDN structure comprised of traces with decoupling capacitors. Criteria for identifying a dominant decoupling capacitor fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b344bb86053b486cdccc10fcc7ef98b5
https://doi.org/10.1109/temc.2012.2194786
https://doi.org/10.1109/temc.2012.2194786
Publikováno v:
2012 IEEE International Symposium on Electromagnetic Compatibility.
Switching currents in active integrated circuits (ICs) generate noise in the power distribution network (PDN), which is one of the main sources for many signal/power integrity and electromagnetic interference issues in high-speed electronic devices.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ab84ca92d0b41030fd8d5c4d2300bd6e
https://doi.org/10.1109/isemc.2012.6350932
https://doi.org/10.1109/isemc.2012.6350932
Autor:
Jun Fan, Hanfeng Wang, Hayato Takeuchi, Jingook Kim, Liang Li, Yuzo Takita, Songping Wu, Kenji Araki
Publikováno v:
2011 IEEE International Symposium on Electromagnetic Compatibility.
This paper presents a measurement-based data-processing approach to obtain parameters of multiple current components through a bulk decoupling capacitor for power integrity studies. A lab-made low-cost current probe is developed to measure the induce
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9dd8233058bc65ddf1a55f35b7d4c91e
https://doi.org/10.1109/isemc.2011.6038347
https://doi.org/10.1109/isemc.2011.6038347