Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Yuya Sakakura"'
Autor:
Kentaro TANAKA, Kazuo HANAKAWA, Yuya SAKAKURA, Kei NAMBA, Naoshi FUJIKA, Tomoya OHIDA, Kenichi ARIYADA, Ryo NAGASHIMA, Kyosuke TSUTSUMI, Tsukasa TSUCHIYA, Yasunobu NAKAMURA, Masahiko MURAO
Publikováno v:
Surgery for Cerebral Stroke. 51:173-177
Autor:
Yuya Sakakura, Ayataka Fujimoto, Tohru Okanishi, Yosuke Masuda, Mitsuyo Nishimura, Hideo Enoki
Publikováno v:
Interdisciplinary Neurosurgery, Vol 14, Iss , Pp 50-52 (2018)
Introduction: Intracranial subdural empyema (ISDE) can cause drug-resistant epilepsy. We attempted to cure post-ISDE refractory epilepsy by operative surgery and assessed the neuropathological findings. Patient and method: A 23-year-old right-handed
Externí odkaz:
https://doaj.org/article/42be3280aa6c4fb1baa109ccf9dd55f3
Publikováno v:
Japanese Journal of Neurosurgery. 30:402-407
Autor:
Ryuichi Noda, Yuta Tamai, Masato Inoue, Shota Ozaki, Shunsuke Yanagisawa, Tetsuo Hara, Yuya Sakakura
Publikováno v:
Japanese Journal of Neurosurgery. 29:805-810
Autor:
Shota, Ozaki, Shunsuke, Yanagisawa, Yuya, Sakakura, Ryuichi, Noda, Yuta, Tamai, Masato, Inoue, Kouichiro, Okamoto, Toru, Igari, Tetsuo, Hara
Publikováno v:
No shinkei geka. Neurological surgery. 49(1)
Autor:
Hideo Enoki, Tohru Okanishi, Yosuke Masuda, Ayataka Fujimoto, Mitsuyo Nishimura, Yuya Sakakura
Publikováno v:
Interdisciplinary Neurosurgery, Vol 14, Iss, Pp 50-52 (2018)
Introduction: Intracranial subdural empyema (ISDE) can cause drug-resistant epilepsy. We attempted to cure post-ISDE refractory epilepsy by operative surgery and assessed the neuropathological findings. Patient and method: A 23-year-old right-handed
Autor:
Yuki Amano, Hirokazu Nakatogawa, Takayuki Masui, Haruhiko Sato, Yuya Sakakura, Daiki Uchida, Teiji Nakayama, Tetsuro Sameshima, Tokutaro Tanaka, Naoto Kuroda, Naoto Ando
Publikováno v:
World neurosurgery. 130
Background Magnetic resonance imaging (MRI) artifacts of adjustable shunt devices are thought to be similar to metal clip artifacts, in that they are larger with higher field strength scanners. We have published several reports about the artifacts of